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參數(shù)資料
| 型號： | TLC372I |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | LIN CMOS DUAL DIFFERENTIAL COMPARATORS |
| 中文描述： | 林的CMOS雙差分比較器 |
| 文件頁數(shù)： | 5/20頁 |
| 文件大?。?/td> | 426K |
| 代理商： | TLC372I |
SLCS114D NOVEMBER 1983 REVISED APRIL 2004
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics at specified free-air temperature, V
DD
= 5 V, T
A
= 25
°
C (unless otherwise
noted)
PARAMETER
TEST CONDITIONS
TLC372Y
TYP
UNIT
MIN
MAX
VIO
IIO
IIB
Input offset voltage
VIC = VICRmin,
See Note 4
1
5
mV
Input offset current
1
pA
Input bias current
5
pA
VICR
Common-mode input voltage range
0 to
VDD1
V
IOH
VOL
IOL
IDD
All characteristics are measured with zero common-mode input voltage unless otherwise noted. IMPORTANT: See Parameter Measurement
Information.
NOTE 4: The offset voltage limits given are the maximum values required to drive the output above 4 V or below 400 mV with a 10-k
resistor
between the output and VDD. They can be verified by applying the limit value to the input and checking for the appropriate output state.
High-level output current
VID = 1 V,
VID = 1 V,
VID = 1 V,
VID = 1 V,
VOH = 5 V
IOL = 4 mA
VOL = 1.5 V
No load
0.1
nA
Low-level output voltage
150
400
mV
Low-level output current
6
16
mA
μ
A
Supply current (two comparators)
150
300
PARAMETER MEASUREMENT INFORMATION
The digital output stage of the TLC372 can be damaged if it is held in the linear region of the transfer curve.
Conventional operational amplifier/comparator testing incorporates the use of a servo loop that is designed to force
the device output to a level within this linear region. Since the servo-loop method of testing cannot be used, the
following alternatives for measuring parameters such as input offset voltage, common-mode rejection, etc., are
offered.
To verify that the input offset voltage falls within the limits specified, the limit value is applied to the input as shown
in Figure 1(a). With the noninverting input positive with respect to the inverting input, the output should be high. With
the input polarity reversed, the output should be low.
A similar test can be made to verify the input offset voltage at the common-mode extremes. The supply voltages can
be slewed as shown in Figure 1(b) for the V
ICR
test, rather than changing the input voltages, to provide greater
accuracy.
5 V
5.1 k
VO
Applied VIO
Limit
VO
5.1 k
1 V
4 V
+
+
(a) VIO WITH VIC = 0
(b) VIO WITH VIC = 4 V
Applied VIO
Limit
Figure 1. Method for Verifying That Input Offset Voltage is Within Specified Limits
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| TLC372IDR | 功能描述:校驗器 IC Dual LinCMOS Differential RoHS:否 制造商:STMicroelectronics 產(chǎn)品: 比較器類型: 通道數(shù)量: 輸出類型:Push-Pull 電源電壓-最大:5.5 V 電源電壓-最小:1.1 V 補償電壓（最大值）:6 mV 電源電流（最大值）:1350 nA 響應(yīng)時間: 最大工作溫度:+ 125 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:SC-70-5 封裝:Reel |
| TLC372IDRG4 | 功能描述:校驗器 IC Dual LinCMOS Differential RoHS:否 制造商:STMicroelectronics 產(chǎn)品: 比較器類型: 通道數(shù)量: 輸出類型:Push-Pull 電源電壓-最大:5.5 V 電源電壓-最小:1.1 V 補償電壓（最大值）:6 mV 電源電流（最大值）:1350 nA 響應(yīng)時間: 最大工作溫度:+ 125 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:SC-70-5 封裝:Reel |
| TLC372IP | 功能描述:校驗器 IC Dual Hi Speed Line RoHS:否 制造商:STMicroelectronics 產(chǎn)品: 比較器類型: 通道數(shù)量: 輸出類型:Push-Pull 電源電壓-最大:5.5 V 電源電壓-最小:1.1 V 補償電壓（最大值）:6 mV 電源電流（最大值）:1350 nA 響應(yīng)時間: 最大工作溫度:+ 125 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:SC-70-5 封裝:Reel |
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