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參數(shù)資料
| 型號(hào)： | TLC372C |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | LIN CMOS DUAL DIFFERENTIAL COMPARATORS |
| 中文描述： | 林的CMOS雙差分比較器 |
| 文件頁數(shù)： | 6/20頁 |
| 文件大?。?/td> | 426K |
| 代理商： | TLC372C |
SLCS114D NOVEMBER 1983 REVISED APRIL 2004
6
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
A close approximation of the input offset voltage can be obtained by using a binary search method to vary the
differential input voltage while monitoring the output state. When the applied input voltage differential is equal, but
opposite in polarity, to the input offset voltage, the output changes states.
Figure 2 illustrates a practical circuit for direct dc measurement of input offset voltage that does not bias the
comparator into the linear region. The circuit consists of a switching-mode servo loop in which U1a generates a
triangular waveform of approximately 20-mV amplitude. U1b acts as a buffer, with C2 and R4 removing any residual
dc offset. The signal is then applied to the inverting input of the comparator under test, while the noninverting input
is driven by the output of the integrator formed by U1c through the voltage divider formed by R9 and R10. The loop
reaches a stable operating point when the output of the comparator under test has a duty cycle of exactly 50%, which
can only occur when the incoming triangle wave is sliced symmetrically or when the voltage at the noninverting input
exactly equals the input offset voltage.
Voltage divider R9 and R10 provides a step up of the input offset voltage by a factor of 100 to make measurement
easier. The values of R5, R8, R9, and R10 can significantly influence the accuracy of the reading; therefore, it is
suggested that their tolerance level be 1% or lower.
Measuring the extremely low values of input current requires isolation from all other sources of leakage current and
compensation for the leakage of the test socket and board. With a good picoammeter, the socket and board leakage
can be measured with no device in the socket. Subsequently, this open-socket leakage value can be subtracted from
the measurement obtained with a device in the socket to obtain the actual input current of the device.
R6
5.1 k
Buffer
U1b
1/4 TLC274C
R1
240 k
C2
1
μ
F
R4
47 k
U1a
1/4 TLC274CN
U1c
1/4 TLC274CN
R2
10 k
R3
100 k
C1
0.1
μ
F
R10
100
,
1%
R9
10 k
, 1%
R7
1 M
R8
1.8 k
, 1%
R5
1.8 k
, 1%
VDD
DUT
Integrator
VIO
(X100)
C3
0.68
μ
F
C4
0.1
μ
F
Triangle
Generator
+
+
+
Figure 2. Circuit for Input Offset Voltage Measurement
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