參數(shù)資料
型號(hào): TLC354D
廠商: Texas Instruments, Inc.
英文描述: LinCMOSE QUADRUPLE DIFFERENTIAL COMPARATORS
中文描述: LinCMOSE翻兩番差比較器
文件頁數(shù): 9/11頁
文件大小: 183K
代理商: TLC354D
TLC354
LinCMOS
QUADRUPLE DIFFERENTIAL COMPARATORS
SLCS116B – SEPTEMBER 1985 – REVISED FEBRUARY 1997
9
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
Response time is defined as the interval between the application of an input step function and the instant when the
output reaches 50% of its maximum value. Response time, low-to-high-level output, is measured from the trailing
edge of the input pulse. Response-time measurement at low input signal levels can be greatly affected by the input
offset voltage. The offset voltage should be balanced by the adjustment at the inverting input (as shown in Figure 3)
so that the circuit is just at the transition point. Then a low signal, for example, 105-mV or 5-mV overdrive, causes
the output to change.
50%
OUT
5.1 k
1
μ
F
VDD
Pulse Generator
CL
(see Note A)
50
1 k
0.1
μ
F
TEST CIRCUIT
10
10 Turn
1 V
–1 V
Input
Offset Voltage
Compensation
Adjustment
VOLTAGE WAVEFORMS
tPLH
tr
10%
90%
100 mV
Overdrive
Input
Low-to-High-
Level Ouptut
50%
10%
tPLH
tf
90%
100 mV
Overdrive
Input
High-to-Low-
Level Ouptut
NOTE A: CL includes probe and jig capacitance.
Figure 3. Response, Rise, and Fall Times Test Circuit and Voltage Waveforms
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TLC354IN 制造商:TI 制造商全稱:Texas Instruments 功能描述:LinCMOSE QUADRUPLE DIFFERENTIAL COMPARATORS