參數(shù)資料
型號: TL751M08CKTG
廠商: Texas Instruments, Inc.
元件分類: 基準電壓源/電流源
英文描述: LOW-DROPOUT VOLTAGE REGULATORS
中文描述: 低壓差電壓調(diào)節(jié)器
文件頁數(shù): 5/12頁
文件大?。?/td> 169K
代理商: TL751M08CKTG
TL750M TL751MSERIES
LOW-DROPOUT VOLTAGE REGULATORS
SLVS021H – JANUARY 1988 – REVISED JANUARY 2000
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics, V
I
= 14 V, I
O
= 300 mA, ENABLE at 0 V for TL751M10, T
J
= 25
°
C (unless
otherwise noted) (see Note 3)
PARAMETER
TEST CONDITIONS
TL750M10C
TL751M10C
UNIT
MIN
9.9
TYP
10
MAX
10.1
Output voltage
V
TJ = 0
°
C to 125
°
C
VI = 12 V to 18 V,
VI = 11 V to 26 V,
VI = 13 V to 23 V,
IO = 5 mA to 750 mA
IO = 500 mA
IO = 750 mA
f = 10 Hz to 100 kHz
9.8
10.2
Input voltage regulation
IO = 250 mA
IO = 250 mA
f = 120 Hz
15
43
mV
20
75
Ripple rejection
50
55
dB
Output voltage regulation
30
100
mV
Dropout voltage
0.5
V
0.6
Output noise voltage
1000
μ
V
Bias current
IO = 750 mA
IO = 10 mA
ENABLE VIH
2 V
60
75
mA
5
Bias current (TL751Mxx only)
200
μ
A
NOTE 3: Pulse-testing techniques maintain the junction temperature as close to the ambient temperature as possible. Thermal effects must be
taken into account separately. All characteristics are measured with a 0.1-
μ
F capacitor across the input and a 10-
μ
F tantalum capacitor
on the output, with equivalent series resistance within the guidelines shown in Figure 3.
electrical characteristics, V
I
= 14 V, I
O
= 300 mA, ENABLE at 0 V for TL751M12, T
J
= 25
°
C (unless
otherwise noted) (see Note 3)
PARAMETER
TEST CONDITIONS
TL750M12C
TL751M12C
UNIT
MIN
11.88
TYP
12
MAX
12.12
Output voltage
V
TJ = 0
°
C to 125
°
C
VI = 14 V to 19 V,
VI = 13 V to 26 V,
VI = 13 V to 23 V,
IO = 5 mA to 750 mA
IO = 500 mA
IO = 750 mA
f = 10 Hz to 100 kHz
11.76
12.24
Input voltage regulation
IO = 250 mA
IO = 250 mA
f = 120 Hz
15
43
mV
20
78
Ripple rejection
50
55
dB
Output voltage regulation
30
120
mV
Dropout voltage
0.5
V
0.6
Output noise voltage
1000
μ
V
Bias current
IO = 750 mA
IO = 10 mA
ENABLE VIH
2 V
60
75
mA
5
Bias current (TL751Mxx only)
200
μ
A
NOTE 3: Pulse-testing techniques maintain the junction temperature as close to the ambient temperature as possible. Thermal effects must be
taken into account separately. All characteristics are measured with a 0.1-
μ
F capacitor across the input and a 10-
μ
F tantalum capacitor
on the output, with equivalent series resistance within the guidelines shown in Figure 3.
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