
June 1999 TOKO, Inc.
Page 3
TK15328
SW6
~
10 kHz
1 Vrms
SW8
10 k
SW7
SW3
V
V
THD
SW2
SW5
SW4
VCC
50 k
SW1
L
SW9
1 kHz
1 Vrms
or
2 Vrms
~
50 k
+
33 μF
+
33 μF
+
+
10 μF
10 μF
VEE
L
H
H
SW1
TEST CIRCUITS AND METHODS
Figure 1
SUPPLY CURRENT (FIGURE 1)
This current is a consumption current with a nonloading
condition.
1) Bias supply to Pins 2,4,9,11. (This condition is the same
with other measurements, omitted from the next for
simplicity)
2) Contact Pin 5 to V
, Pin 8 is low level or open.
2) Measure the inflow current to Pin 1 from V
CC
. This current is
the supply current.
A
VCC
50 K
50 K
50 K
50 K
VEE
VCC
~
Cont.
+
VEE
+
+
Figure 2
1: The above condition represents 1ch.
2: The above conditions distortion rate of 1-Ach and dynamic range measurement.
3: SW5 is for residual noise measurement.
4: SW8 is for cross talk (ISO or SEP) measurement.
CONTROL LOW/HIGH LEVEL (FIGURE 2)
This level is to measure the threshold level.
1) Input, the V
to Pin 1 and input V
to Pin 12. (This
condition is the same with other measurements, omitted
from the next for simplicity)
2) Input to Pin 4 with sine wave (f = 1 kHz, V
IN
= 1 Vrms).
3) Connect an oscilloscope to Pin 3.
4) Pin 8 is low level or the open, and elevate Pin 5 voltage
gradually from 0 V until the sine wave appears at the
oscilloscope. This voltage is the threshold level when
the wave appears.