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4-161
TELCOM SEMICONDUCTOR, INC.
7
6
5
4
3
1
2
8
TC96C555
3A OUTPUT PROGRAMMABLE
POWER OSCILLATOR
ELECTRICAL CHARACTERISTICS:
specifications over operating temperature range unless otherwise
specified 5.0V < V
DD
<
18V.
Symbol
Parameter
Test Condition
Min
Typ
Max
Unit
Programmable Current Range
Pin 4 Input Current for I
SOURCE
Control
Pin 1 Input Current for I
SINK
Control
(V
REF
-V
R1
) / R
CHG
Fig. 2
(V
REF
-V
R2
) / R
DIS
Fig. 2
5.0
5.0
–
–
100
100
μ
A
μ
A
Reference Section
V
REF
V
DD
= 7 to 18V
I
REF
= 0 to 1mA
V
DRIFT
TCV
REF
V
R1,
V
R2
V
REF
-V
R
V
ih
V
il
V
ih
to V
il
I
REF
Oscillator
Voltage Stability
Temperature Stability
Power Supply
I
DD
Switching Time
1
t
R
t
F
t
D1
t
D2
Output
V
OH
V
OL
R
O
R
O
I
PK
V
DD
= 15V
Line Regulation of V
REF
Load Regulation of V
REF
V
REF
Drift Over Lifetime
V
REF
Tempco
Voltage Pin at 1 and 4
Voltage Across R
CHG
and R
DIS
Pin 2, High Switching Threshold
Pin 2, Low Switching Threshold
Delta High to Low Threshold
V
REF
Pin 3 Short to GND Pin 5
I
REF
= 10
μ
A
3.6
–
–
–
–
2.7
0.8
1.75
0.75
0.9
–
4
4.4
1.5
0.4
5
2000
3.3
1.2
2.25
1.25
1.1
18
V
0.9
0.1
–
1100
3
1
2
1
1.0
–
%/V
%/mA
%
ppm/
°
C
V
V
V
V
V
mA
– 55
≤
Temp
≤
125
°
C
V
DD
= 15V
V
DD
= 15V
V
DD
= 15V
V
DD
= 15V
V
DD
= 15V
V
DD
= 7V to 18V
– 55
≤
Temp
≤
125
°
C
–
–
1
8
–
%/V
%/
°
C
0.4
Power Supply Current
0
≤
V
IN
≤
3V
–
–
4
mA
Rise Time
Fall Time
Delay Time
Delay Time
C1 = 180pF, Fig. 1
C1 = 1800pF, Fig. 1
Fg. 1
Fig. 1
–
–
–
–
33
30
180
160
40
40
220
200
nsec
nsec
nsec
nsec
High Output Voltage
Low Output Voltage
Output Res Hi State
Output Res Lo State
Peak Output Current
V
DD
– 0.025
–
–
–
–
–
–
–
V
V
A
0.025
6
6
–
V
DD
= 15V
V
DD
= 15V
V
DD
= 18V
4.5
3.4
2
NOTE :
1
Switching times guaranteed by design.
The typical values are from 125
°
C measurements.
Static-sensitive device. Unused devices must be stored in conductive material. Protect devices from static discharge and static fields. Stresses above those
listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device
at these or any other conditions above those indicated in the Operational Specifications is not implied. Any exposure to Absolute Maximum Rating
Conditions may affect device reliability.