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參數(shù)資料
| 型號(hào)： | SVFL283R3S/H+ |
| 元件分類： | 電源模塊 |
| 英文描述： | 1-OUTPUT 66 W DC-DC REG PWR SUPPLY MODULE |
| 文件頁數(shù)： | 2/17頁 |
| 文件大?。?/td> | 396K |
| 代理商： | SVFL283R3S/H+ |
SVFL2800S Series
DS2X010B
10
RHA TEST CIRCUIT DIAGRAM
CS RES
1
2
3
4
5
67
8
9
10
11
12
INH SW
NC
+28V
DAQ1-
DAQ2+
DAQ2-
DAQ1+
DAQ3-
DAQ3+
NC
SVFL2800S
28V IN
IN COM
TRIM
INH1
SYNC OUT
SYNC IN
INH2
SHARE
+S
-S
OUTCOM
+V OUT
NC
CS RES
DAQ4+
DAQ4-
LOAD
1
2
4
3
LOAD SW
NO LOAD
FULL LOAD
SHORTCKT
DAQ5+
DAQ5-
Figure 8
FREQUENCY OF RHA TESTING
Every initial wafer lot of critical semiconductor components has been characterized and tested at HDR as well
as at LDR to determine if there is ELDRS sensitivity. If a specific component type is determined to have
ELDRS sensitivity, all future wafer lots of that specific component will be tested at LDR. If no ELDRS
sensitivity is shown in the initial wafer lot testing, future wafer lots of those specific components will not be
tested at LDR. All future critical semiconductor component wafer lots are tested at HDR. If the components
test to the same level (within 15% of the previous 99/90 RLAT level) or better as the wafer lot used to
characterize the converter family, the converter family is not re-characterized. If the components test to a
worse level, one of the following actions is performed (depending on the test level passed):
1. Component lot is not used in VPT RHA assured product.
2. Component lot is used if WCA (Worst Case Analysis) performed on the new lot against the original
characterization WCA determines the component level characterized will not negatively impact the
assured product characterization level.
3. The assured product is re-characterized using the new component lot.
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相關(guān)代理商/技術(shù)參數(shù) |
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| SVG-100A483AAT | 制造商:CALIBER 制造商全稱:Caliber Electronics Inc. 功能描述:14 Pin and 6 Pin / SMD / HCMOS / VCXO Oscillator |
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| SVG-100A483AT | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:14 Pin and 6 Pin / SMD / HCMOS / VCXO Oscillator |
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