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參數(shù)資料
| 型號(hào)： | STF2HNK60Z |
| 廠商： | 意法半導(dǎo)體 |
| 英文描述： | N-CHANNEL 600V - 4.4ヘ - 2.0A TO-92/TO-220FP/IPAK Zener-Protected SuperMESH MOSFET |
| 中文描述： | N溝道600V的- 4.4ヘ- 2.0安培TO-92/TO-220FP/IPAK齊納MOSFET的保護(hù)SuperMESH |
| 文件頁數(shù)： | 3/12頁 |
| 文件大?。?/td> | 405K |
| 代理商： | STF2HNK60Z |
3/12
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
ELECTRICAL CHARACTERISTICS
(T
CASE
=25
°
C UNLESS OTHERWISE SPECIFIED)
ON/OFF
Symbol
Parameter
V
(BR)DSS
Drain-source
Breakdown Voltage
I
DSS
Zero Gate Voltage
Drain Current (V
GS
= 0)
V
DS
= Max Rating, T
C
= 125
°
C
I
GSS
Gate-body Leakage
Current (V
DS
= 0)
V
GS(th)
Gate Threshold Voltage
V
DS
= V
GS
, I
D
= 50 μA
R
DS(on)
Static Drain-source On
Resistance
DYNAMIC
Symbol
g
fs
(1)
C
iss
C
oss
C
rss
SOURCE DRAIN DIODE
Symbol
I
SD
I
SDM
(2)
V
SD
(1)
t
rr
Q
rr
I
RRM
t
rr
Q
rr
I
RRM
Note: 1. Pulsed: Pulse duration = 300 μs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
3. C
oss eq.
is defined as a constant equivalent capacitance giving the same charging time as C
oss
when V
DS
increases from 0 to 80%
V
DSS
.
Test Conditions
I
D
= 1 mA, V
GS
= 0
Min.
600
Typ.
Max.
Unit
V
V
DS
= Max Rating
1
50
μA
μA
V
GS
= ± 20V
±10
μA
3
3.75
4.5
V
V
GS
= 10V, I
D
= 1.0 A
4.4
4.8
Parameter
Test Conditions
V
DS
= 15 V
,
I
D
= 1.0 A
V
DS
= 25V, f = 1 MHz, V
GS
= 0
Min.
Typ.
1.5
Max.
Unit
S
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
Equivalent Output
Capacitance
Turn-on Delay Time
Rise Time
Turn-off Delay Time
Fall Time
280
38
7
pF
pF
pF
C
oss eq.
(3)
V
GS
= 0V, V
DS
= 0V to 480V
30
pF
t
d(on)
t
r
t
d(off)
t
f
Q
g
Q
gs
Q
gd
V
DD
= 300 V, I
D
= 1.0 A
R
G
= 4.7
V
GS
= 10 V
(Resistive Load see, Figure 3)
10
30
23
50
ns
ns
ns
ns
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
V
DD
= 480V, I
D
= 2.0 A,
V
GS
= 10V
11
2.25
6
15
nC
nC
nC
Parameter
Test Conditions
Min.
Typ.
Max.
2.0
8.0
Unit
A
A
Source-drain Current
Source-drain Current (pulsed)
Forward On Voltage
I
SD
= 2.0 A, V
GS
= 0
I
SD
= 2.0 A, di/dt = 100 A/μs
V
DD
= 20 V, T
j
= 25
°
C
(see test circuit, Figure 5)
1.6
V
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
178
445
5
ns
nC
A
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
I
SD
= 13 A, di/dt = 100 A/μs
V
DD
= 20 V, T
j
= 150
°
C
(see test circuit, Figure 5)
200
500
5
ns
nC
A
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