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Introduction
1.1 Library Description
SEC ASIC
1-1
STD110
1.1
Library
Description
SEC ASIC offers STD110 as 0.25um CMOS standard cell library. SEC's 0.25um
cell-based logic process providing up to 5 layers of interconnect metal with
various I/O pad-pitch options such as 70um pitch pad and 80um pitch pad.
STD110 which reduced power dissipation and system cost by merging the logic
and IPs as a whole and connecting internally from logic to memory data bus is
ideal for high-performance products such as graphics controller, projector,
portable CD and so on.
STD110 can support up to eight million gate counts of logic providing 75% of
usable gate. STD110 is 25% faster than 0.35um library MDL90. Logic density is
2.3 times greater than that of MDL90. The power consumption of compiled
memory is 90% smaller than MDL90.
STD110 also supports fully user-configurable compiled memory and datapath
elements. Each element is provided as a compiler. Two different types of
compiled memories in STD110 are available to support memories suitable to
high-density and low-power applications.
To support mixed voltage environments, 2.5V, 3.3V drive and 5V-tolerant IO cells
are available. LVTTL, LVCMOS, PCI, OSC, AGP, PECL, HSTL, LVDS and USB
buffers are supported. To better support a system-on-chip design style, various
core cells are available including processor cores like ARM7TDMI/ARM9TDMI/
ARM920T/ARM940T from ARM, Teaklite and Oak from DSPG.
The STD110 supports data transmission and communication core such as USB,
IEEE1284 and UART.
The list of analog core cells includes ADC, DAC, CODEC, LVDS, RAMDAC and
PLL with various bits and frequency ranges.
SEC design methodology offers an comprehensive timing driven design flow
including automated time budgeting, tight floorplan synthesis intergration,
powerful timing analysis and timing driven layout. Its advanced characterization
flow provides accurate timing data and robust delay models for a 0.25um very
deep-submicron technology. Advanced verification methods like static timing
analysis and formal verification provide an effective verification methodology with
a variety of simulators and cycle based simulation. SEC DFT methodology
supports scan design, BIST and JTAG boundary scan. SEC provides a full set of
test-ready IPs with an efficient core test integration methodology.