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參數(shù)資料
| 型號(hào)： | SPC5604BF2MLQ6 |
| 廠商： | Freescale Semiconductor |
| 文件頁(yè)數(shù)： | 65/109頁(yè) |
| 文件大?。?/td> | 0K |
| 描述： | IC MCU 32BIT 512KB FLASH 144LQFP |
| 標(biāo)準(zhǔn)包裝： | 60 |
| 系列： | MPC56xx Qorivva |
| 核心處理器： | e200z0h |
| 芯體尺寸： | 32-位 |
| 速度： | 64MHz |
| 連通性： | CAN，I²C，LIN，SCI，SPI |
| 外圍設(shè)備： | DMA，POR，PWM，WDT |
| 輸入/輸出數(shù)： | 123 |
| 程序存儲(chǔ)器容量： | 512KB（512K x 8） |
| 程序存儲(chǔ)器類型： | 閃存 |
| RAM 容量： | 32K x 8 |
| 電壓 - 電源 (Vcc/Vdd)： | 3 V ~ 5.5 V |
| 數(shù)據(jù)轉(zhuǎn)換器： | A/D 36x10b |
| 振蕩器型： | 內(nèi)部 |
| 工作溫度： | -40°C ~ 125°C |
| 封裝/外殼： | 144-LQFP |
| 包裝： | 托盤 |
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Package pinouts and signal descriptions
MPC5604B/C Microcontroller Data Sheet, Rev. 11.1
Freescale Semiconductor
59
Therefore it is recommended that the user apply EMC software optimization and prequalification tests in relation with the EMC
level requested for his application.
Software recommendations:
The software flowchart must include the management of runaway conditions such as:
— Corrupted program counter
— Unexpected reset
— Critical data corruption (control registers...)
Prequalification trials:
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the reset pin or the oscillator pins for 1 second.
To complete these trials, ESD stress can be applied directly on the device. When unexpected behavior is detected, the
software can be hardened to prevent unrecoverable errors occurring.
3.20.2
Electromagnetic interference (EMI)
The product is monitored in terms of emission based on a typical application. This emission test conforms to the IEC 61967-1
standard, which specifies the general conditions for EMI measurements.
3.20.3
Absolute maximum ratings (electrical sensitivity)
Based on two different tests (ESD and LU) using specific measurement methods, the product is stressed in order to determine
its performance in terms of electrical sensitivity.
3.20.3.1
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of each sample according
to each pin combination. The sample size depends on the number of supply pins in the device (3 parts*(n+1) supply pin). This
test conforms to the AEC-Q100-002/-003/-011 standard.
Table 33. EMI radiated emission measurement1,2
1 EMI testing and I/O port waveforms per IEC 61967-1, -2, -4
2 For information on conducted emission and susceptibility measurement (norm IEC 61967-4), please contact your
local marketing representative.
Symbol C
Parameter
Conditions
Value
Unit
Min
Typ Max
—
SR — Scan range
—
0.150
—
1000 MHz
fCPU SR — Operating frequency
—
64
—
MHz
VDD_LV SR — LV operating voltages
—
1.28
—
V
SEMI CC T Peak level
VDD = 5V, TA =25°C,
LQFP144 package
Test conforming to IEC 61967-2,
fOSC = 8 MHz/fCPU = 64 MHz
No PLL frequency
modulation
—
18
dB
V
±2% PLL frequency
modulation
—
14
dB
V
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SPC5604BF2VLQ6 | 制造商:Freescale Semiconductor 功能描述: |
| SPC5604BK0MLQ6 | 功能描述:e200z0h MPC56xx Qorivva Microcontroller IC 32-Bit 64MHz 512KB (512K x 8) FLASH 144-LQFP (20x20) 制造商:nxp usa inc. 系列:MPC56xx Qorivva 包裝:托盤 零件狀態(tài):在售 核心處理器:e200z0h 核心尺寸:32-位 速度:64MHz 連接性:CAN，I2C，LIN，SCI，SPI 外設(shè):DMA，POR，PWM，WDT I/O 數(shù):123 程序存儲(chǔ)容量:512KB（512K x 8） 程序存儲(chǔ)器類型:閃存 EEPROM 容量:4K x 16 RAM 容量:32K x 8 電壓 - 電源（Vcc/Vdd）:3 V ~ 5.5 V 數(shù)據(jù)轉(zhuǎn)換器:A/D 36x10b 振蕩器類型:內(nèi)部 工作溫度:-40°C ~ 125°C（TA） 封裝/外殼:144-LQFP 供應(yīng)商器件封裝:144-LQFP（20x20） 標(biāo)準(zhǔn)包裝:300 |
| SPC5604CECLQ | 制造商:FREESCALE 制造商全稱:Freescale Semiconductor, Inc 功能描述:Microcontroller |
| SPC5604CECLU | 制造商:FREESCALE 制造商全稱:Freescale Semiconductor, Inc 功能描述:Microcontroller |
| SPC5604CECMG | 制造商:FREESCALE 制造商全稱:Freescale Semiconductor, Inc 功能描述:Microcontroller |
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