參數(shù)資料
型號: SP3222EUEY-L
廠商: Exar Corporation
文件頁數(shù): 5/20頁
文件大小: 0K
描述: IC TXRX RS232 ESD TRUE 20TSSOP
標準包裝: 74
類型: 收發(fā)器
驅(qū)動器/接收器數(shù): 2/2
規(guī)程: RS232
電源電壓: 3 V ~ 5.5 V
安裝類型: 表面貼裝
封裝/外殼: 20-TSSOP(0.173",4.40mm 寬)
供應商設(shè)備封裝: 20-TSSOP
包裝: 管件
其它名稱: SP3222EUEY-L-ND
Exar Corporation 48720 Kato Road, Fremont CA, 94538 510-668-7017 www.exar.com
SP3222EU/SP3232EU_102_031413
13
DEVICE PIN
HUMAN BODY
IEC61000-4-2
TESTED
MODEL
Air Discharge
Direct Contact
Level
Driver Outputs
+15kV
+8kV
4
Receiver Inputs
+15kV
+8kV
4
equipment from a person already holding
the equipment. The current is transferred
on to the keypad or the serial port of the
equipment directly and then travels through
the PCB and finally to the IC.
The circuit models in Figures 19 and 20 rep-
resent the typical ESD testing circuit used for
all three methods. The C
S is initially charged
with the DC power supply when the first
switch (SW1) is on. Now that the capacitor
is charged, the second switch (SW2) is on
while SW1 switches off. The voltage stored
in the capacitor is then applied through R
S,
the current limiting resistor, onto the device
under test (DUT). In ESD tests, the SW2
switch is pulsed so that the device under
test receives a duration of voltage.
For the Human Body Model, the current
limitingresistor(R
S) and the source capacitor
(C
S) are 1.5k an 100pF, respectively. For
IEC-61000-4-2, the current limiting resistor
(R
S) and the source capacitor (CS) are 330
an 150pF, respectively.
Figure 21. ESD Test Waveform for IEC61000-4-2
Figure 20. ESD Test Circuit for IEC61000-4-2
Table 3. Transceiver ESD Tolerance Levels
RS and RV add up to 330 for IEC61000-4-2.
RC
Device
Under
Test
DC Power
Source
CS
RS
SW1
SW2
RV
Contact-Discharge Model
t = 0ns
t = 30ns
0A
15A
30A
I→
t →
The higher C
S value and lower RS value in
the IEC61000-4-2 model are more stringent
than the Human Body Model. The larger
storage capacitor injects a higher voltage
to the test point when SW2 is switched on.
The lower current limiting resistor increases
the current charge onto the test point.
DESCRIPTION
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