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參數(shù)資料
| 型號： | SNJ54HC688W |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 算術(shù)邏輯單元 |
| 英文描述： | HC/UH SERIES, 8-BIT IDENTITY COMPARATOR, INVERTED OUTPUT, CDFP20 |
| 封裝： | CERAMIC, DFP-20 |
| 文件頁數(shù)： | 8/15頁 |
| 文件大?。?/td> | 549K |
| 代理商： | SNJ54HC688W |
SN54HC688, SN74HC688
8-BIT IDENTITY COMPARATORS
SCLS010D – DECEMBER 1982 – REVISED AUGUST 2003
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
logic diagram (positive logic)
2
3
4
5
6
7
8
9
11
12
13
P0
P1
P2
P3
P4
P5
Q0
Q1
Q2
Q3
Q4
P = Q
14
15
16
17
18
1
P6
Q5
P7
Q6
Q7
19
OE
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, VCC
–0.5 V to 7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, IIK (VI < 0 or VI > VCC) (see Note 1)
±20 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output clamp current, IOK (VO < 0 or VO > VCC) (see Note 1)
±20 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous output current, IO (VO = 0 to VCC)
±25 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous current through VCC or GND
±50 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Package thermal impedance,
θJA (see Note 2): DW package
58
°C/W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
N package
69
°C/W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
PW package
83
°C/W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, Tstg
–65
°C to 150°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES:
1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51-7.
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