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參數(shù)資料
| 型號： | SNJ54BCT8245AFKR |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | BCT/FBT SERIES, 8-BIT BOUNDARY SCAN TRANSCEIVER, TRUE OUTPUT, CQCC28 |
| 封裝： | CERAMIC, LCC-28 |
| 文件頁數(shù)： | 12/30頁 |
| 文件大?。?/td> | 630K |
| 代理商： | SNJ54BCT8245AFKR |
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SN54BCT8245A, SN74BCT8245A
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS
SCBS043E MAY 1990 REVISED JULY 1996
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 772511443
description (continued)
Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output
(TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing
functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation
(PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
The SN54BCT8245A is characterized for operation over the full military temperature range of 55
°C to 125°C.
The SN74BCT8245A is characterized for operation from 0
°C to 70°C.
FUNCTION TABLE
(normal mode)
INPUTS
OPERATION
OE
DIR
OPERATION
L
B data to A bus
L
H
A data to B bus
H
X
Isolation
logic symbol
SCAN
’BCT8245A
TDI
14
TDI
TCK-IN
G3
24
TMS
12
TMS
13
TCK
3 EN1 [BA]
1
DIR
TCK-OUT
OE
Φ
2
3 EN2 [AB]
11
TDO
11
TDO
A1
23
A2
22
B1
2
B2
3
A3
21
B3
4
A4
20
B4
5
A5
19
B5
7
A6
17
B6
8
A7
16
B7
9
A8
15
B8
10
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the DW, JT, and NT packages.
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