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| 型號： | SNJ54AS810FKR |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 門電路 |
| 英文描述： | AS SERIES, QUAD 2-INPUT XNOR GATE, CQCC20 |
| 封裝： | CERAMIC, LCC-20 |
| 文件頁數(shù)： | 1/5頁 |
| 文件大小： | 63K |
| 代理商： | SNJ54AS810FKR |
SN54ALS810, SN54AS810, SN74ALS810, SN74AS810
QUADRUPLE 2-INPUT EXCLUSIVE-NOR GATES
SDAS160 – D2837, MARCH 1984 – REVISED OCTOBER 1988
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Copyright
1988, Texas Instruments Incorporated
5BASIC
1
Package Options include Plastic “Small
Outline” Packages, Ceramic Chip Carriers,
and Standard Plastic and Ceramic 300-mil
DIPs
Dependable Texas Instruments Quality and
Reliability
description
These
devices
contain
four
independent
Exclusive-NOR gates. They perform the Boolean
functions Y = A + B = (A + B)
(A + B) in positive
logic.
A common application is a true/complement
element. If one of the inputs is high, the other input
will be reproduced in true form at the output. If one
of the inputs is low, the signal on the other input will
be reproduced inverted at the output.
The
SN54ALS810
and
SN54AS810
are
characterized for operation over the full military
temperature range of – 55
°C to 125°C. The
SN74ALS810 and SN74AS810 are characterized
for operation from 0
°C to 70°C.
logic symbol
3
1Y
1
1A
2Y
6
3Y
8
4Y
11
1B
2
2A
4
2B
5
3A
9
3B
10
4A
12
4B
13
= 1
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Pin numbers shown are for D, J, and N packages.
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
1Y
2A
2B
2Y
GND
VCC
4B
4A
4Y
3B
3A
3Y
SN54ALS810, SN54AS810 ...J PACKAGE
SN74ALS810, SN74AS810 ...D OR N PACKAGE
(TOP VIEW)
3
2
1 20 19
910 11 12 13
4
5
6
7
8
18
17
16
15
14
4A
NC
4Y
NC
3B
1Y
NC
2A
NC
2B
SN54ALS810, SN54AS810 . . . FK PACKAGE
(TOP VIEW)
1B
1A
NC
3Y
3A
4B
2Y
GND
NC
V
CC
INPUTS
OUTPUT
Y
FUNCTION TABLE
(each gate)
NC–No internal connection
A
L
H
L
H
L
H
B
L
H
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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