參數(shù)資料
型號(hào): SNJ54ALS12AFKR
廠商: TEXAS INSTRUMENTS INC
元件分類: 門電路
英文描述: ALS SERIES, TRIPLE 3-INPUT NAND GATE, CQCC20
封裝: CERAMIC, LCC-20
文件頁(yè)數(shù): 1/3頁(yè)
文件大小: 42K
代理商: SNJ54ALS12AFKR
SN54ALS12A, SN74ALS12A
TRIPLE 3-INPUT POSITIVE-NAND GATES
WITH OPEN-COLLECTOR OUTPUTS
SDAS008A – MARCH 1984 – REVISED MAY 1986
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Copyright
1986, Texas Instruments Incorporated
5BASIC
1
Package Options Include Plastic Small
Outline Packages, Ceramic Chip Carriers,
and Standard Plastic and Ceramic 300-mil
DIPs
Dependable Texas Instruments Quality and
Reliability
description
These devices contain three independent 3-input
NAND gates with open-collector outputs. These
gates perform the Boolean functions Y = A
BC or
Y = A+B+C in positive logic. The open-collector
outputs require pullup resistors to perform
correctly.
They may be connected to other
open-collector outputs to implement active-low
wired-OR or active-high wired-AND functions.
Open-collector devices are often used to generate
higher VOH levels.
The SN54ALS12A is characterized for operation
over the full military temperature range of – 55
°C
to 125
°C. The SN74ALS12A is characterized for
operation from 0
°C to 70°C.
FUNCTION TABLE
(each gate)
INPUTS
OUTPUT
A
B
C
Y
H
L
XX
H
X
LX
H
X
L
H
logic symbol
11
3C
&
8
3Y
6
2Y
12
1Y
3B
10
3A
9
2C
5
2B
4
2A
3
1C
13
2
1B
1A
1
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Pin numbers shown are for D, J, and N packages.
3B
2B
1B
3A
3C
3Y
2A
2C
2Y
1Y
1C
1A
logic diagram (positive logic)
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
2A
2B
2C
2Y
GND
VCC
1C
1Y
3C
3B
3A
3Y
SN54ALS12A ...J PACKAGE
SN74ALS12A ...D OR N PACKAGE
(TOP VIEW)
3
2
1 20 19
910 11 12 13
4
5
6
7
8
18
17
16
15
14
1Y
NC
3C
NC
3B
2A
NC
2B
NC
2C
SN54ALS12A . . . FK PACKAGE
(TOP VIEW)
1B
1A
NC
3Y
3A
1C
2Y
GND
NC
NC – No internal connection
V
CC
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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