參數(shù)資料
型號: SN74AHCT00MPWREP
廠商: TEXAS INSTRUMENTS INC
元件分類: 門電路
英文描述: AHCT/VHCT SERIES, QUAD 2-INPUT NAND GATE, PDSO14
封裝: GREEN, PLASTIC, TSSOP-14
文件頁數(shù): 1/8頁
文件大?。?/td> 269K
代理商: SN74AHCT00MPWREP
SN74AHCT00EP
QUADRUPLE 2INPUT POSITIVENAND GATES
SCLS507 JUNE 2003
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
D Controlled Baseline
One Assembly/Test Site, One Fabrication
Site
D Extended Temperature Performance of
55
°C to 125°C
D Enhanced Diminishing Manufacturing
Sources (DMS) Support
D Enhanced Product-Change Notification
D Qualification Pedigree
D Inputs Are TTL-Voltage Compatible
Component qualification in accordance with JEDEC and industry
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification testing
should not be viewed as justifying use of this component beyond
specified performance and environmental limits.
D Latch-Up Performance Exceeds 250 mA Per
JESD 17
D ESD Protection Exceeds JESD 22
2000-V Human-Body Model (A114-A)
200-V Machine Model (A115-A)
description/ordering information
The ’AHCT00 device performs the Boolean function Y = A
B or Y = A + B in positive logic.
ORDERING INFORMATION
TA
PACKAGE
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
55
°C to 125°C
SOIC D
Tape and reel
SN74AHCT00MDREP
AHCT00MEP
55
°C to 125°C
TSSOP PW
Tape and reel
SN74AHCT00MPWREP
AHT00EP
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines
are available at www.ti.com/sc/package.
FUNCTION TABLE
(each gate)
INPUTS
OUTPUT
A
B
OUTPUT
Y
H
L
XH
X
L
H
logic diagram, each gate (positive logic)
A
B
Y
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
1Y
2A
2B
2Y
GND
VCC
4B
4A
4Y
3B
3A
3Y
D OR PW PACKAGE
(TOP VIEW)
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright
2003, Texas Instruments Incorporated
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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