參數(shù)資料
型號: SN74ABT8952DWRE4
廠商: Texas Instruments
文件頁數(shù): 7/31頁
文件大?。?/td> 0K
描述: IC SCAN TESST DEVICE 28-SOIC
標準包裝: 1,000
系列: 74ABT
邏輯類型: 掃描測試設(shè)備,帶寄存總線收發(fā)器
電源電壓: 4.5 V ~ 5.5 V
位數(shù): 8
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 28-SOIC(0.295",7.50mm 寬)
供應(yīng)商設(shè)備封裝: 28-SOIC
包裝: 帶卷 (TR)
SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
15
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
parallel-signature analysis (PSA)
Data appearing at the selected device input pins is compressed into a 16-bit parallel signature in the
shift-register elements of the selected BSCs on each rising edge of TCK. This data is updated in the shadow
latches of the selected input BSCs and applied to the inputs of the normal on-chip logic. Data in the shadow
latches of the selected output BSCs remains constant and is applied to the device outputs. Figures 6 and 7
illustrate the 16-bit linear-feedback shift-register algorithms through which the signature is generated. An initial
seed value should be scanned into the BSR before performing this operation.
=
MASKX
A8-I
B8-O
A7-I
A6-I
A5-I
A4-I
A3-I
A2-I
A1-I
B7-O
B6-O
B5-O
B4-O
B3-O
B2-O
B1-O
Figure 6. 16-Bit PSA Configuration (OEAB = 0, OEBA = 1)
=
MASKX
B8-I
A8-O
B7-I
B6-I
B5-I
B4-I
B3-I
B2-I
B1-I
A7-O
A6-O
A5-O
A4-O
A3-O
A2-O
A1-O
Figure 7. 16-Bit PSA Configuration (OEAB = 1, OEBA = 0)
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