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| 型號(hào)： | SN74ABT8646DWR |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類(lèi)： | 總線收發(fā)器 |
| 英文描述： | ABT SERIES, 8-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO28 |
| 封裝： | GREEN, PLASTIC, SOIC-28 |
| 文件頁(yè)數(shù)： | 15/32頁(yè) |
| 文件大?。?/td> | 529K |
| 代理商： | SN74ABT8646DWR |
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SN54ABT8646, SN74ABT8646
SCAN TEST DEVICES WITH
OCTAL BUS TRANSCEIVERS AND REGISTERS
SCBS123F AUGUST 1992 REVISED APRIL 2004
22
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
TA = 25°C
SN54ABT8646
SN74ABT8646
UNIT
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNIT
VIK
VCC = 4.5 V,
II = 18 mA
1.2
V
VCC = 4.5 V,
IOH = 3 mA
2.5
VOH
VCC = 5 V,
IOH = 3 mA
3
V
VOH
VCC = 4.5 V
IOH = 24 mA
2
V
VCC = 4.5 V
IOH = 32 mA
2*
2
VOL
VCC = 4.5 V
IOL = 48 mA
0.55
V
VOL
VCC = 4.5 V
IOL = 64 mA
0.55*
0.55
V
II
CLK, DIR,
OE, S, TCK
VCC = 5.5 V, VI = VCC or GND
±1
A
II
A or B ports
VCC = 5.5 V, VI = VCC or GND
±100
A
IIH
TDI, TMS
VCC = 5.5 V,
VI = VCC
10
A
IIL
TDI, TMS
VCC = 5.5 V,
VI = GND
40
160
40
160
40
160
A
IOZH
VCC = 5.5 V,
VO = 2.7 V
50
A
IOZL
VCC = 5.5 V,
VO = 0.5 V
50
A
Ioff
VCC = 0,
VI or VO ≤ 4.5 V
±100
A
IOZPU
VCC = 0 to 2 V,
VO = 0.5 V or 2.7 V
±50
A
IOZPD
VCC = 2 V to 0,
VO = 0.5 V or 2.7 V
±50
A
ICEX
Outputs high
VCC = 5.5 V,
VO = 5.5 V
50
A
IO§
VCC = 5.5 V,
VO = 2.5 V
50
100
180
50
180
50
180
mA
VCC = 5.5 V,
Outputs high
0.9
2
ICC
A or B ports
VCC = 5.5 V,
IO = 0,
V = V
or GND
Outputs low
30
38
mA
ICC
A or B ports
IO = 0,
VI = VCC or GND
Outputs disabled
0.9
2
mA
ICC
VCC = 5.5 V, One input at 3.4 V,
1.5
mA
ICC
VCC = 5.5 V, One input at 3.4 V,
Other inputs at VCC or GND
1.5
mA
Ci
Control inputs
VI = 2.5 V or 0.5 V
3
pF
Cio
A or B ports
VO = 2.5 V or 0.5 V
10
pF
Co
TDO
VO = 2.5 V or 0.5 V
8
pF
* On products compliant to MIL-PRF-38535, this parameter does not apply.
All typical values are at VCC = 5 V.
The parameters IOZH and IOZL include the input leakage current.
§ Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
This is the increase in supply current for each input that is at the specified TTL voltage level, rather than VCC or GND.
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