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| 型號(hào)： | SN74ABT245BZQNR |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | ABT SERIES, 8-BIT TRANSCEIVER, TRUE OUTPUT, PBGA20 |
| 封裝： | GREEN, PLASTIC, VFBGA-20 |
| 文件頁(yè)數(shù)： | 21/26頁(yè) |
| 文件大?。?/td> | 1070K |
| 代理商： | SN74ABT245BZQNR |
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SN54ABT245A, SN74ABT245B
OCTAL BUS TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCBS081L JANUARY 1991 REVISED APRIL 2005
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
TA = 25°C
SN54ABT245A
SN74ABT245B
UNIT
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNIT
VIK
VCC = 4.5 V,
II = 18 mA
1.2
V
VCC = 4.5 V,
IOH = 3 mA
2.5
V
VCC = 5 V,
IOH = 3 mA
3
V
VOH
V
45V
IOH = 24 mA
2
V
VCC = 4.5 V
IOH = 32 mA
2*
2
V
45V
IOL = 48 mA
0.55
V
VOL
VCC = 4.5 V
IOL = 64 mA
0.55*
0.55
V
Vhys
100
mV
Control inputs
VCC = 0 to 5.5 V, VI = VCC or GND
±1
II
A or B ports
VCC = 2.1 V to 5.5 V,
VI = VCC or GND
±20
±100
±20
μA
IOZPU
VCC = 0 to 2.1 V,
VO = 0.5 V to 2.7 V, OE = X
±50
μA
IOZPD
VCC = 2.1 V to 0,
VO = 0.5 V to 2.7 V, OE = X
±50
μA
IOZH
VCC = 2.1 V to 5.5 V,
VO = 2.7 V, OE ≥ 2 V
10
μA
IOZL
VCC = 2.1 V to 5.5 V,
VO = 0.5 V, OE ≥ 2 V
10
μA
Ioff
VCC = 0,
VI or VO ≤ 5.5 V
±100
μA
ICEX
VCC = 5.5 V,
VO = 5.5 V
Outputs high
50
μA
IO§
VCC = 5.5 V,
VO = 2.5 V
50
140
180
50
180
50
180
mA
VCC = 5.5 V,
Outputs high
5
250
μA
ICC
A or B ports
VCC = 5.5 V,
IO = 0,
Outputs low
22
30
mA
ICC
A or B ports
IO
0,
VI = VCC or GND
Outputs disabled
1
250
μA
Data inputs
VCC = 5.5 V,
One input at 3.4 V,
Outputs enabled
1.5
mA
ΔICC
Data inputs
One input at 3.4 V,
Other inputs at
VCC or GND
Outputs disabled
50
μA
Control inputs
VCC = 5.5 V, One input at 3.4 V,
Other inputs at VCC or GND
1.5
mA
Ci
Control inputs
VI = 2.5 V or 0.5 V
4
pF
Cio
A or B ports
VO = 2.5 V or 0.5 V
8
pF
* On products compliant to MIL-PRF-38535, this parameter does not apply.
All typical values are at VCC = 5 V.
The parameters IOZH and IOZL include the input leakage current.
§ Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
This is the increase in supply current for each input that is at the specified TTL voltage level, rather than VCC or GND.
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