參數(shù)資料
型號(hào)： SN74ABT18502PM
廠商： TEXAS INSTRUMENTS INC
元件分類(lèi)： 總線(xiàn)收發(fā)器
英文描述： ABT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PQFP64
封裝： GREEN, PLASTIC, LQFP-64
文件頁(yè)數(shù)： 30/32頁(yè)
文件大?。?/td> 578K
代理商： SN74ABT18502PM
SN74ABT18502
SCAN TEST DEVICE
WITH 18-BIT REGISTERED BUS TRANSCEIVER
SCBS753 – FEBRUARY 2002
7
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Exit1-DR, Exit2-DR
The Exit1-DR and Exit2-DR states are temporary states used to end a DR scan. It is possible to return to the
Shift-DR state from either Exit1-DR or Exit2-DR without recapturing the DR.
On the first falling edge of TCK after entry to Exit1-DR, TDO goes from the active state to the high-impedance
state.
Pause-DR
No specific function is performed in the stable Pause-DR state, in which the TAP controller can remain
indefinitely. The Pause-DR state provides the capability of suspending and resuming DR scan operations
without loss of data.
Update-DR
If the current instruction calls for the selected DR to be updated with current data, such update occurs on the
falling edge of TCK following entry to the Update-DR state.
Capture-IR
When an IR scan is selected, the TAP controller must pass through the Capture-IR state. In the Capture-IR state,
the IR captures its current status value. This capture operation occurs on the rising edge of TCK, upon which
the TAP controller exits the Capture-IR state.
For the SN74ABT18502, the status value loaded in the Capture-IR state is the fixed binary value 10000001.
Shift-IR
Upon entry to the Shift-IR state, the IR is placed in the scan path between TDI and TDO and, on the first falling
edge of TCK, TDO goes from the high-impedance state to an active state. TDO enables to the logic level present
in the LSB of the IR.
While in the stable Shift-IR state, instruction data is serially shifted through the IR on each TCK cycle. The first
shift occurs on the first rising edge of TCK after entry to the Shift-IR state (i.e., no shifting occurs during the TCK
cycle in which the TAP controller changes from Capture-IR to Shift-IR or from Exit2-IR to Shift-IR). The last shift
occurs on the rising edge of TCK upon which the TAP controller exits the Shift-IR state.
Exit1-IR, Exit2-IR
The Exit1-IR and Exit2-IR states are temporary states used to end an IR scan. It is possible to return to the
Shift-IR state from either Exit1-IR or Exit2-IR without recapturing the IR.
On the first falling edge of TCK after entry to Exit1-IR, TDO goes from the active state to the high-impedance
state.
Pause-IR
No specific function is performed in the stable Pause-IR state, in which the TAP controller can remain
indefinitely. The Pause-IR state provides the capability of suspending and resuming IR scan operations without
loss of data.
Update-IR
The current instruction is updated and takes effect on the falling edge of TCK following entry to the Update-IR
state.
相關(guān)PDF資料
PDF描述
SN74ABT18504PMRG4 ABT SERIES, 20-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PQFP64
SN74ABT18640DGGR ABT SERIES, DUAL 9-BIT BOUNDARY SCAN TRANSCEIVER, INVERTED OUTPUT, PDSO56
SN74ABT18640DLR ABT SERIES, DUAL 9-BIT BOUNDARY SCAN TRANSCEIVER, INVERTED OUTPUT, PDSO56
SN74ABT2240ADWRG4 ABT SERIES, DUAL 4-BIT DRIVER, INVERTED OUTPUT, PDSO20
SN74ABT2240APWE4 ABT SERIES, DUAL 4-BIT DRIVER, INVERTED OUTPUT, PDSO20
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN74ABT18502PMG4 功能描述:特定功能邏輯 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT18502PMR 功能描述:特定功能邏輯 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT18502PMRG4 功能描述:特定功能邏輯 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT18502PN 制造商:TI 功能描述:74ABT18502 S1A4B
SN74ABT18504 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
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