參數(shù)資料
型號(hào): SN54HC259FK
廠商: TEXAS INSTRUMENTS INC
元件分類: 鎖存器
英文描述: HC/UH SERIES, LOW LEVEL TRIGGERED D LATCH, TRUE OUTPUT, CQCC20
封裝: CERAMIC, LCC-20
文件頁數(shù): 8/12頁
文件大?。?/td> 205K
代理商: SN54HC259FK
SN54HC259, SN74HC259
8-BIT ADDRESSABLE LATCHES
SCLS134B – DECEMBER 1982 – REVISED MAY 1997
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
logic symbol, each internal latch
D
C
R
Q
1D
C1
1R
logic diagram, each internal latch (positive logic)
C
R
Q
TG
C
TG
C
D
absolute maximum ratings over operating free-air temperature range
Supply voltage range, VCC
–0.5 V to 7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, IIK (VI < 0 or VI > VCC) (see Note 1)
±20 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output clamp current, IOK (VO < 0 or VO > VCC) (see Note 1)
±20 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous output current, IO (VO = 0 to VCC)
±25 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous current through VCC or GND
±50 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Package thermal impedance,
θJA (see Note 2): D package
113
°C/W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
N package
78
°C/W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
PW package
149
°C/W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, Tstg
–65
°C to 150°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES:
1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51, except for through-hole packages, which use a trace
length of zero.
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