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參數(shù)資料
| 型號(hào)： | SN54ABT32318PN |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | ABT SERIES, 18-BIT EXCHANGER, TRUE OUTPUT |
| 文件頁數(shù)： | 1/9頁 |
| 文件大?。?/td> | 152K |
| 代理商： | SN54ABT32318PN |
SN54ABT32318, SN74ABT32318
18BIT TRIPORT UNIVERSAL BUS EXCHANGERS
SCBS180A JUNE 1992 REVISED JULY 1994
Copyright
1994, Texas Instruments Incorporated
51
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 772511443
Members of the Texas Instruments
Widebus +
Family
State-of-the-Art EPIC-ΙΙB BiCMOS Design
Significantly Reduces Power Dissipation
UBE (Universal Bus Exchanger)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
Latch-Up Performance Exceeds 500 mA
Per JEDEC Standard JESD-17
Typical V
OLP (Output Ground Bounce)
< 0.8 V at VCC = 5 V, TA = 25°C
Distributed V
CC and GND Pin Configuration
Minimizes High-Speed Switching Noise
High-Drive Outputs (32-mA I
OH,
64-mA IOL)
Bus Hold Inputs Eliminate the Need for
External Pullup/Pulldown Resistors
Packaged in 80-Pin Plastic Thin Quad
Flat (PN) Package With 12
× 12-mm Body
Using 0.5-mm Lead Pitch
22 23
C8
C7
C6
GND
C5
C4
C3
C2
C1
VCC
GND
B18
B17
B16
B15
B14
GND
B13
B12
B11
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
24
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
A2
A3
A4
GND
A5
A6
A7
A8
A9
VCC
GND
A10
A11
A12
A13
A14
GND
A15
A16
A17
25 26 27 28
SN74ABT32318 . . . PN PACKAGE
(TOP VIEW)
GND
79 78 77 76 75
80
74
OEA
OEC
SELC
LEC
CLKC
C18
C17
GND
B4
LEA
OEB
SELB
LEB
CLKB
B1
B2
72 71 70
73
29 30 31 32 33
69 68
21
A18
C15
67 66 65 64
34 35 36 37
B5
B6
B7
GND
C14
C13
C12
GND
A1
SELA
B8
B9
38 39 40
C1
1
C10
63 62 61
V
CC
C16
C9
CC
V
CLKA
B3
B10
Widebus+, EPIC-
ΙΙB, and UBE are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
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