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| 型號： | SN54ABT18504 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| 中文描述： | 掃描測試設(shè)備與20位通用總線收發(fā)器 |
| 文件頁數(shù)： | 1/30頁 |
| 文件大?。?/td> | 450K |
| 代理商： | SN54ABT18504 |
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SN54ABT18504, SN74ABT18504
SCAN TEST DEVICES WITH
20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS108B – AUGUST 1992 – REVISED JUNE 1993
SCOPE
Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, and
P1149.1A CLAMP and HIGHZ
– Parallel Signature Analysis at Inputs With
Masking Option
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
Packaged in 64-Pin Plastic Thin Quad Flat
Pack Using 0.5-mm Center-to-Center
Spacings and 68-Pin Ceramic Quad Flat
Pack Using 25-mil Center-to-Center
Spacings
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Copyright
1993, Texas Instruments Incorporated
1
Members of the Texas Instruments
SCOPE
Family of Testability Products
Members of the Texas Instruments
Widebus
Family
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
UBT
(Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
Two Boundary-Scan Cells per I/O for
Greater Flexibility
State-of-the-Art EPIC-
ΙΙ
B
BiCMOS Design
Significantly Reduces Power Dissipation
B5
B6
B7
GND
B8
B9
B10
V
CC
NC
B11
B12
B13
B14
GND
B15
B16
B17
A4
A5
A6
GND
A7
A8
A9
A10
NC
V
CC
A11
A12
A13
GND
A14
A15
A16
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
V
N
T
C
A
A
A
G
O
L
T
N
T
L
O
A
G
A
C
C
T
A
C
B
G
B
B
B
G
B
B
28 29 30 31 32 33 34
8 7
6
5
4
9
3
1 68 67
2
35 36 37 38 39
66 65
27
64 63 62 61
40 41 42 43
SN54ABT18504 . . . HV PACKAGE
(TOP VIEW)
C
NC – No internal connection
C
V
A
B
SCOPE, Widebus, UBT, and EPIC-
ΙΙ
B are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
parameters.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN54ABT18640 | SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS |
| SN74ABT18640DGG | RP10 (EW) Series - Powerline Regulated DC-DC Converters; Input Voltage (Vdc): 48V; Output Voltage (Vdc): 15V; 4:1 Wide Input Voltage Range; 10 Watts Output Power; 1.6kVDC Isolation; Fixed Operating Frequency; Six-Sided Continuous Shield; Standard 50.8 x25.4x10.2mm Package; Efficiency to 84% |
| SN54ABT18640WD | SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS |
| SN54ABT18646HV | SCAN TEST DEVICE WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABT18652 | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABT18504_08 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABT18504HV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABT18640 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS |
| SN54ABT18640WD | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS |
| SN54ABT18646 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICE WITH 18-BIT TRANSCEIVERS AND REGISTERS |
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