參數(shù)資料
型號: SI6542DQ
廠商: Vishay Intertechnology,Inc.
元件分類: MOSFETs
英文描述: P-Channel 20-V (D-S) MOSFET,Low-Threshold
中文描述: P通道20V(D-S)MOSFET 低閾值
文件頁數(shù): 2/6頁
文件大?。?/td> 82K
代理商: SI6542DQ
Si6542DQ
Vishay Siliconix
www.vishay.com FaxBack 408-970-5600
2-2
Document Number: 70171
S-00873—Rev. F, 01-May-00
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Static
Gate Threshold Voltage
V
GS(th)
V
DS
= V
GS
, I
D
= 250 A
N-Ch
1.0
V
V
DS
= V
GS
, I
D
= –250 A
P-Ch
–1.0
Gate-Body Leakage
I
GSS
V
DS
= 0 V, V
GS
=
20 V
100
nA
Zero Gate Voltage Drain Current
V l
D i C
I
DSS
V
DS
= 20 V, V
GS
= 0 V
N-Ch
1
A
V
DS
= –20 V, V
GS
= 0 V
P-Ch
–1
V
DS
= 20 V, V
GS
= 0 V, T
J
= 55 C
N-Ch
25
V
DS
= –20 V, V
GS
= 0 V, T
J
= 55 C
P-Ch
–25
On-State Drain Current
a
I
D(on)
V
DS
= 5 V, V
GS
= 10 V
N-Ch
14
A
V
DS
= –5 V, V
GS
= –10 V
P-Ch
–10
D i S
Drain-Source On-State Resistance
O S
a
V
GS
= 10 V, I
D
= 2.5 A
N-Ch
0.065
0.09
r
DS(on)
V
GS
= –10 V, I
D
= 1.9 A
P-Ch
0.13
0.17
V
GS
= 4.5 V, I
D
=
1.8
A
N-Ch
0.100
0.175
V
GS
= –4.5 V, I
D
= 1.3 A
P-Ch
0.26
0.32
Forward Transconductance
a
g
fs
V
DS
= 15 V, I
D
= 2.5 A
N-Ch
5
S
V
DS
= –15 V, I
D
= – 1.9 A
P-Ch
3
Diode Forward Voltage
a
V
SD
I
S
= 1.25 A, V
GS
= 0 V
N-Ch
0.8
1.2
V
I
S
= –1.25 A, V
GS
= 0 V
P-Ch
0.8
–1.2
Dynamic
b
Total Gate Charge
Q
g
N Ch
N-Channel
N Channel
N-Ch
7
10
P-Ch
7
10
Gate-Source Charge
Q
gs
V
DS
= 10 V,
V
GS
= 10 V, I
D
= 2.5 A
N-Ch
0.9
nC
P-Channel
= 10 V V
= 10 V I
= 1 9 A
V
DS
= –10 V,
GS
= –10 V, I
D
= –1.9 A
P-Ch
1.3
Gate-Drain Charge
Q
gd
N-Ch
2.1
P-Ch
1.7
Turn-On Delay Time
t
d(on)
N Ch
N-Channel
N-Ch
11
20
P-Ch
9
20
Rise Time
t
r
V
= 10 V, R
= 10
1 A, V
GEN
= 10 V, R
G
= 6
N-Ch
11
20
I
D
P-Ch
12
25
Turn-Off Delay Time
t
d(off)
P-Channel
10 V R
V
= –10 V, R
= 10
–1 A, V
= 10 V, R
= 6
1 A, V
GEN
G
6
N-Ch
16
30
ns
I
D
P-Ch
17
30
Fall Time
t
f
N-Ch
6
15
P-Ch
6
15
Source-Drain Reverse Recovery Time
t
rr
I
F
= 1.25 A, di/dt = 100 A/ s
N-Ch
45
70
I
F
= –1.25 A, di/dt = 100 A/ s
P-Ch
35
70
Notes
a.
b.
Pulse test; pulse width
300 s, duty cycle
2%.
Guaranteed by design, not subject to production testing.
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