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參數(shù)資料
| 型號(hào)： | SDS3823E-150.0000 |
| 廠商： | PERICOM SEMICONDUCTOR CORP |
| 元件分類(lèi)： | XO, clock |
| 英文描述： | CRYSTAL OSCILLATOR, CLOCK, 150 MHz, LVDS OUTPUT |
| 封裝： | ROHS COMPLIANT, CERAMIC PACKAGE-6 |
| 文件頁(yè)數(shù)： | 4/6頁(yè) |
| 文件大?。?/td> | 287K |
| 代理商： | SDS3823E-150.0000 |
4
DS 276 Rev 01 | 06/28/06
SDS382 Series
2.5V LVDS Low Jitter
Crystal Clock Oscillator (XO)
Pericom Semiconductor Corporation 1-800-435-2336 http://www.pericom.com/saronix
All specifications are subject to change without notice.
Test Circuit
Absolute Maximum Ratings
Parameter
Min.
Typ.
Max.
Units
Notes
Storage temperature
-55
+125
°C
Reliability Test Ratings
This product is rated to meet the following test conditions:
Type
Parameter
Test Condition
Mechanical
Shock
MIL-STD-883, Method 2002, Condition B
Mechanical
Solderability
JESD22-B102-D Method 2 (Preconditioning E)
Mechanical
Terminal strength
MIL-STD-883, Method 2004, Condition D
Mechanical
Gross leak
MIL-STD-883, Method 1014, Condition C
Mechanical
Fine leak
MIL-STD-883, Method 1014, Condition A2 (R1 = 2x10-8 atm cc/s)
Mechanical
Solvent resistance
MIL-STD-202, Method 215
Environmental
Thermal shock
MIL-STD-883, Method 1011, Condition A
Environmental
Moisture resistance
MIL-STD-883, Method 1004
Environmental
Vibration
MIL-STD-883, Method 2007, Condition A
Environmental
Resistance to soldering heat
J-STD-020C Table 5-2 Pb-free devices (2 cycles max)
Output Enable/Disable Function
Rate Select Function
65
4
12
3
50
Test Point
(Termination
internal to sco
0.01μF
0.1μF
+2V
-1.3V
Output Enable/Disable Function
(OE function present on specified pin)
65
4
12
3
50
Test Point
(Termination
internal to scope
0.1μF
+1.3V
-1.2V
0.01μF
0.1μF
0.01μF
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