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  • 參數(shù)資料
    型號(hào): SD-14531F3-474
    廠商: DATA DEVICE CORP
    元件分類: 位置變換器
    英文描述: SYNCHRO OR RESOLVER TO DIGITAL CONVERTER, CDMA36
    封裝: CERAMIC, FP-36
    文件頁(yè)數(shù): 7/16頁(yè)
    文件大?。?/td> 170K
    代理商: SD-14531F3-474
    15
    Data Device Corporation
    www.ddc-web.com
    SD-14531
    ORDERING INFORMATION
    (see TABLE 8 for reference and signal transformer ordering information)
    SD-14531XX-XXXX
    Supplemental Process Requirements:
    S = Pre-Cap Source Inspection
    L = Pull Test
    Q = Pull Test and Pre-Cap Inspection
    K = One Lot Date Code
    W = One Lot Date Code and PreCap Source
    Y = One Lot Date Code and 100% Pull Test
    Z = One Lot Date Code, PreCap Source and 100% Pull Test
    Blank = None of the Above
    Accuracy:
    2 = ±5.2 Minutes
    4 = ±2.6 Minutes
    5 = ±1.3 Minutes Resolver Mode, ±1.6 Minutes Synchro Mode (16-Bit Mode only)
    Process Requirements:
    0 = Standard DDC Processing, no Burn-In (See table below.)
    1 = MIL-PRF-38534 Compliant
    2 = B*
    3 = MIL-PRF-38534 Compliant with PIND Testing
    4 = MIL-PRF-38534 Compliant with Solder Dip
    5 = MIL-PRF-38534 Compliant with PIND Testing and Solder Dip
    6 = B* with PIND Testing
    7 = B* with Solder Dip
    8 = B* with PIND Testing and Solder Dip
    9 = Standard DDC Processing with Solder Dip, no Burn-In (See table below.)
    Temperature Grade/Data Requirements:
    1 = -55°C to +125°C
    2 = -40°C to +85°C
    3 = 0°C to +70°C
    4 = -55°C to +125°C with Variables Test Data
    5 = -40°C to +85°C with Variables Test Data
    8 = 0°C to +70°C with Variables Test Data
    Input:
    1 = 11.8/400 Hz
    2 = 90/400 Hz
    3 = 90/60 Hz
    4 = Direct/400 Hz
    5 = Direct/60 Hz
    Package:
    D = DIP
    F = Flat Pack (Consult factory for availability.)
    *Standard DDC Processing with burn-in and full temperature test — see table below.
    1015, Table 1
    BURN-IN
    A
    2001
    CONSTANT ACCELERATION
    C
    1010
    TEMPERATURE CYCLE
    A and C
    1014
    SEAL
    2009, 2010, 2017, and 2032
    INSPECTION
    CONDITION(S)
    METHOD(S)
    TEST
    MIL-STD-883
    STANDARD DDC PROCESSING
    相關(guān)PDF資料
    PDF描述
    SD-14531F3-475S SYNCHRO OR RESOLVER TO DIGITAL CONVERTER, CDMA36
    SD-14531F3-475Y SYNCHRO OR RESOLVER TO DIGITAL CONVERTER, CDMA36
    SD-14531F3-475 SYNCHRO OR RESOLVER TO DIGITAL CONVERTER, CDMA36
    SD-14531F3-482L SYNCHRO OR RESOLVER TO DIGITAL CONVERTER, CDMA36
    SD-14531F3-482S SYNCHRO OR RESOLVER TO DIGITAL CONVERTER, CDMA36
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