參數(shù)資料
型號: SCAN18540T
廠商: National Semiconductor Corporation
英文描述: Inverting Line Driver with TRI-STATE Outputs
中文描述: 反相線驅(qū)動器與三態(tài)輸出
文件頁數(shù): 11/14頁
文件大?。?/td> 152K
代理商: SCAN18540T
AC Operating Requirements
Scan Test Operation
Symbol
Parameter
V
CC
(V)
(Note 7)
Military
Units
T
A
= 55C to +125C
C
L
= 50 pF
Guaranteed Minimum
3.0
t
S
Setup Time, H or L
Data to TCK (Note 8)
Hold Time, H or L
TCK to Data (Note 8)
Setup Time, H or L
AOE
n
, BOE
n
to TCK (Note 10)
Hold Time, H or L
TCK to AOE
n
,
BOE
n
(Note 10)
Setup Time, H or L
Internal AOE, BOE,
to TCK (Note 9)
Hold Time, H or L
TCK to Internal
AOE, BOE (Note 9)
Setup Time, H or L
TMS to TCK
Hold Time, H or L
TCK to TMS
Setup Time, H or L
TDI to TCK
Hold Time, H or L
TCK to TDI
Pulse Width TCK
5.0
ns
t
H
5.0
5.5
ns
t
S
5.0
3.0
ns
t
H
5.0
4.5
ns
t
S
5.0
3.0
ns
t
H
5.0
3.0
ns
t
S
5.0
8.0
ns
t
H
5.0
2.0
ns
t
S
5.0
4.0
ns
t
H
5.0
4.5
ns
t
W
5.0
H
L
12.0
5.0
25
ns
f
max
Maximum TCK
Clock Frequency
Wait Time,
Power Up to TCK
Power Down Delay
5.0
MHz
T
PU
5.0
100
ns
T
DN
0.0
100
ms
Note 7:
Voltage Range 5.0 is 5.0V
±
0.5V.
All Input Timing Delays involving TCK are measured from the rising edge of TCK.
Note 8:
This delay represents the timing relationship between the data input and TCK at the associated scan cells numbered 0-8, 9-17, 18-26, and 27-35.
Note 9:
This delay represents the timing relationship between AOE/BOE and TCK for scan cells 36 and 39 only.
Note 10:
Timing pertains to BSR 37, 38, 40 and 41.
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