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參數(shù)資料
| 型號： | SCAN18373T |
| 廠商： | National Semiconductor Corporation |
| 英文描述： | Transparent Latch with TRI-STATE Outputs(帶三態(tài)輸出的透明鎖存器) |
| 中文描述： | 透明鎖存器與三態(tài)輸出（帶三態(tài)輸出的透明鎖存器） |
| 文件頁數(shù)： | 4/14頁 |
| 文件大?。?/td> | 170K |
| 代理商： | SCAN18373T |
Description of Boundary-Scan Circuitry
The scan cells used in the BOUNDARY-SCAN register are
one of the following two types depending upon their location.
Scan cell TYPE1 is intended to solely observe system data,
while TYPE2 has the additional ability to control system
data. (See IEEE Standard 1149.1 for a further description of
scan cell TYPE1 and for a further description of scan cell
TYPE2.)
Scan cell TYPE1 is located on each system input pin while
scan cell TYPE2 is located at each system output pin as well
as at each of the two internal active-high output enable sig-
nals. AOE controls the activity of the A-outputs while BOE
controls the activity of the B-outputs. Each will activate their
respective outputs by loading a logic high.
The BYPASS register is a single bit shift register stage iden-
tical to scan cell TYPE1. It captures a fixed logic low.
The INSTRUCTION register is an eight-bit register which
captures the value 00111101.
The two least significant bits of this captured value (01) are
required by IEEE Std 1149.1. The upper six bits are unique
to the SCAN18373T device. SCAN CMOS TestAccess Logic
devices do not include the IEEE 1149.1 optional identifica-
tion register. Therefore, this unique captured value can be
used as a “pseudo ID” code to confirm that the correct device
is placed in the appropriate location in the boundary scan
chain.
MSB
→
LSB
Instruction Code
00000000
10000001
10000010
00000011
All Others
Instruction
EXTEST
SAMPLE/PRELOAD
CLAMP
HIGHZ
BYPASS
Bypass Register Scan Chain Definition Logic 0
DS100321-9
Instruction Register Scan Chain Definition
DS100321-10
Scan Cell TYPE1
DS100321-7
www.national.com
4
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| SCAN18541T | Non-Inverting Line Driver with TRI-STATE Outputs(帶三態(tài)輸出的同相線驅動器) |
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相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| SCAN18373TFMQB WAF | 制造商:Texas Instruments 功能描述: |
| SCAN18373TSSC | 功能描述:閉鎖 Transparent Latch RoHS:否 制造商:Micrel 電路數(shù)量:1 邏輯類型:CMOS 邏輯系列:TTL 極性:Non-Inverting 輸出線路數(shù)量:9 高電平輸出電流: 低電平輸出電流: 傳播延遲時間: 電源電壓-最大:12 V 電源電壓-最小:5 V 最大工作溫度:+ 85 C 最小工作溫度:- 40 C 封裝 / 箱體:SOIC-16 封裝:Reel |
| SCAN18373TSSCX | 功能描述:閉鎖 Transparent Latch RoHS:否 制造商:Micrel 電路數(shù)量:1 邏輯類型:CMOS 邏輯系列:TTL 極性:Non-Inverting 輸出線路數(shù)量:9 高電平輸出電流: 低電平輸出電流: 傳播延遲時間: 電源電壓-最大:12 V 電源電壓-最小:5 V 最大工作溫度:+ 85 C 最小工作溫度:- 40 C 封裝 / 箱體:SOIC-16 封裝:Reel |
| SCAN18374_YDC3026B WAF | 制造商:Fairchild Semiconductor Corporation 功能描述: |
| SCAN18374T | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:D Flip-Flop with TRI-STATE Outputs |
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