參數(shù)資料
型號(hào)： S9S08LG32J0VLK
廠商： Freescale Semiconductor
文件頁(yè)數(shù)： 2/50頁(yè)
文件大?。?/td> 0K
描述： IC MCU 8BIT 32KB FLASH 80LQFP
標(biāo)準(zhǔn)包裝： 90
系列： S08
核心處理器： S08
芯體尺寸： 8-位
速度： 40MHz
連通性： I²C，LIN，SCI，SPI
外圍設(shè)備： LCD，LVD，POR，PWM，WDT
輸入/輸出數(shù)： 69
程序存儲(chǔ)器容量： 32KB（32K x 8）
程序存儲(chǔ)器類型： 閃存
RAM 容量： 1.9K x 8
電壓 - 電源 (Vcc/Vdd)： 2.7 V ~ 5.5 V
數(shù)據(jù)轉(zhuǎn)換器： A/D 16x12b
振蕩器型： 內(nèi)部
工作溫度： -40°C ~ 105°C
封裝/外殼： 80-LQFP
包裝： 托盤
MC9S08LG32 Series Data Sheet, Rev. 9
Electrical Characteristics
Freescale Semiconductor
10
2
Electrical Characteristics
2.1
Introduction
This section contains electrical and timing specifications for the MC9S08LG32 series of microcontrollers available at the time
of publication.
2.2
Parameter Classification
The electrical parameters shown in this supplement are guaranteed by various methods. To give the customer a better
understanding the following classification is used and the parameters are tagged accordingly in the tables where appropriate:
NOTE
The classification is shown in the column labeled “C” in the parameter tables where
appropriate.
2.3
Absolute Maximum Ratings
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not guaranteed. Stress beyond the
limits specified in Table 4 may affect device reliability or cause permanent damage to the device. For functional operating
conditions, refer to the remaining tables in this section.
This device contains circuitry that protects against damage due to high static voltage or electrical fields. However, it is advised
that normal precautions should be taken to avoid application of any voltages higher than maximum-rated voltages to this
high-impedance circuit. Reliability of operation is enhanced if unused inputs are tied to an appropriate logic voltage level (for
instance, either VSS or VDD) or the programmable pull-up resistor associated with the pin is enabled.
77
61
45
PTE3
LCD11
—
78
62
46
PTE2
LCD10
—
79
63
47
PTE1
LCD9
—
80
64
48
PTE0
LCD8
—
Table 3. Parameter Classifications
P
Those parameters are guaranteed during production testing on each individual device.
C
Those parameters are achieved by the design characterization by measuring a statistically relevant
sample size across process variations.
T
Those parameters are achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted. All values shown in the typical column are within this
category.
D
Those parameters are derived mainly from simulations.
Table 2. Pin Availability by Package Pin-Count (continued)
Packages
<-- Lowest
Priority
--> Highest
80
64
48
Port Pin
Alt 1
Alt 2
Alt 3
Alt 4
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