參數(shù)資料
型號(hào)： S-80944
廠商： Seiko Instruments Inc.
英文描述： 4.4V±2.0% Bulit-In Delay Circuit High-Precision Voltage Detector(檢測(cè)范圍4.4 V±2.0%，內(nèi)置延時(shí)電路高精度電壓檢測(cè)器)
中文描述： 4.4V ± 2.0％Bulit，在延遲電路高精度電壓檢測(cè)器（檢測(cè)范圍4.4 V ± 2.0％，內(nèi)置延時(shí)電路高精度電壓檢測(cè)器）
文件頁(yè)數(shù)： 12/24頁(yè)
文件大?。?/td> 172K
代理商： S-80944
BUILT-IN DELAY DIRCUIT HIGH-PRECISION VOLTAGE DETECTOR
S-809 Series
Seiko Instruments Inc.
11
5.
Through-type current
Through-type current refers to the current which flows instantaneously at the time of detection and release of a voltage
detector. Through-type current is large in CMOS output devices, and also flows to some extent in Nch open-drain output
devices.
6.
Oscillation
In applications where a resistor is connected to the voltage detector input (Figure 8), in the CMOS active low products for
example, the through-type current generated when the output goes from low to high (release) causes a voltage drop equal to
[through-type current]
×
[input resistance] across the resistor. When the resultant input voltage drops below the detection
voltage -V
DET
, the output voltage returns to its low level. In this state, the through-type current and its resultant voltage drop
have disappeared, and the output goes back from low to high. A through-type current is again generated, a voltage drop
appears, and the process repeats. This unstable condition is referred to as oscillation.
Misimplementation with input voltage divider
Standard Circuit
Connect directly the C
D
capacitor for delay between C
D
and V
SS
terminals.
RB
RA
OUT
V
IN
V
SS
V
DD
S-809XXAL
(
CMOS output products
)
Figure 8
V
DD
OUT
V
SS
R*
100k
* R is unnecessary for CMOS output products.
Figure 9
C
D
相關(guān)PDF資料
PDF描述
S-80945 4.5V±2.0% Bulit-In Delay Circuit High-Precision Voltage Detector(檢測(cè)范圍4.5 V±2.0%，內(nèi)置延時(shí)電路高精度電壓檢測(cè)器)
S-80946 4.6V±2.0% Bulit-In Delay Circuit High-Precision Voltage Detector(檢測(cè)范圍4.6 V±2.0%，內(nèi)置延時(shí)電路高精度電壓檢測(cè)器)
S-80947 4.7V±2.0% Bulit-In Delay Circuit High-Precision Voltage Detector(檢測(cè)范圍4.7 V±2.0%，內(nèi)置延時(shí)電路高精度電壓檢測(cè)器)
S-80948 4.8V±2.0% Bulit-In Delay Circuit High-Precision Voltage Detector(檢測(cè)范圍4.8 V±2.0%，內(nèi)置延時(shí)電路高精度電壓檢測(cè)器)
S-80949 4.9V±2.0% Bulit-In Delay Circuit High-Precision Voltage Detector(檢測(cè)范圍4.9 V±2.0%，內(nèi)置延時(shí)電路高精度電壓檢測(cè)器)
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S80944CBCC WAF 制造商:Intel 功能描述:
S-80944CLMC-G7E-T2 功能描述:電壓監(jiān)測(cè)器/監(jiān)控器 4.4V 1.2uA CMOS Out RoHS:否 制造商:Texas Instruments 監(jiān)測(cè)電壓數(shù):2 監(jiān)測(cè)電壓:Adjustable 輸出類型:Open Drain 欠電壓閾值: 過電壓閾值: 準(zhǔn)確性:1 % 工作電源電壓:1.5 V to 6.5 V 工作電源電流:1.8 uA 最大工作溫度:+ 125 C 封裝 / 箱體:SON-6 安裝風(fēng)格:SMD/SMT
S-80944CLMC-G7ET2G 功能描述:電壓監(jiān)測(cè)器/監(jiān)控器 4.4V 1.2uA CMOS Out RoHS:否 制造商:Texas Instruments 監(jiān)測(cè)電壓數(shù):2 監(jiān)測(cè)電壓:Adjustable 輸出類型:Open Drain 欠電壓閾值: 過電壓閾值: 準(zhǔn)確性:1 % 工作電源電壓:1.5 V to 6.5 V 工作電源電流:1.8 uA 最大工作溫度:+ 125 C 封裝 / 箱體:SON-6 安裝風(fēng)格:SMD/SMT
S-80944CLNB-G7E-T2 功能描述:電壓監(jiān)測(cè)器/監(jiān)控器 4.4V 1.2uA CMOS Out RoHS:否 制造商:Texas Instruments 監(jiān)測(cè)電壓數(shù):2 監(jiān)測(cè)電壓:Adjustable 輸出類型:Open Drain 欠電壓閾值: 過電壓閾值: 準(zhǔn)確性:1 % 工作電源電壓:1.5 V to 6.5 V 工作電源電流:1.8 uA 最大工作溫度:+ 125 C 封裝 / 箱體:SON-6 安裝風(fēng)格:SMD/SMT
S-80944CLNB-G7ET2G 功能描述:電壓監(jiān)測(cè)器/監(jiān)控器 4.4V 1.2uA CMOS Out RoHS:否 制造商:Texas Instruments 監(jiān)測(cè)電壓數(shù):2 監(jiān)測(cè)電壓:Adjustable 輸出類型:Open Drain 欠電壓閾值: 過電壓閾值: 準(zhǔn)確性:1 % 工作電源電壓:1.5 V to 6.5 V 工作電源電流:1.8 uA 最大工作溫度:+ 125 C 封裝 / 箱體:SON-6 安裝風(fēng)格:SMD/SMT
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