- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄374627 > S-80912 (Seiko Instruments Inc.) 1.2 V±2.0% Bulit-In Delay Circuit High-Precision Voltage Detector(檢測范圍1.2 V±2.0%，內(nèi)置延時(shí)電路高精度電壓檢測器) PDF資料下載
參數(shù)資料
| 型號： | S-80912 |
| 廠商： | Seiko Instruments Inc. |
| 英文描述： | 1.2 V±2.0% Bulit-In Delay Circuit High-Precision Voltage Detector(檢測范圍1.2 V±2.0%，內(nèi)置延時(shí)電路高精度電壓檢測器) |
| 中文描述： | 1.2伏特± 2.0％Bulit，在延遲電路高精度電壓檢測器（檢測范圍1.2伏± 2.0％，內(nèi)置延時(shí)電路高精度電壓檢測器） |
| 文件頁數(shù)： | 12/24頁 |
| 文件大?。?/td> | 172K |
| 代理商： | S-80912 |
BUILT-IN DELAY DIRCUIT HIGH-PRECISION VOLTAGE DETECTOR
S-809 Series
Seiko Instruments Inc.
11
5.
Through-type current
Through-type current refers to the current which flows instantaneously at the time of detection and release of a voltage
detector. Through-type current is large in CMOS output devices, and also flows to some extent in Nch open-drain output
devices.
6.
Oscillation
In applications where a resistor is connected to the voltage detector input (Figure 8), in the CMOS active low products for
example, the through-type current generated when the output goes from low to high (release) causes a voltage drop equal to
[through-type current]
×
[input resistance] across the resistor. When the resultant input voltage drops below the detection
voltage -V
DET
, the output voltage returns to its low level. In this state, the through-type current and its resultant voltage drop
have disappeared, and the output goes back from low to high. A through-type current is again generated, a voltage drop
appears, and the process repeats. This unstable condition is referred to as oscillation.
Misimplementation with input voltage divider
Standard Circuit
Connect directly the C
D
capacitor for delay between C
D
and V
SS
terminals.
RB
RA
OUT
V
IN
V
SS
V
DD
S-809XXAL
(
CMOS output products
)
Figure 8
V
DD
OUT
V
SS
R*
100k
* R is unnecessary for CMOS output products.
Figure 9
C
D
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| S-80913 | 1.3 V±2.0% Bulit-In Delay Circuit High-Precision Voltage Detector(檢測范圍1.3 V±2.0%，內(nèi)置延時(shí)電路高精度電壓檢測器) |
| S-80914 | 1.4 V±2.0% Bulit-In Delay Circuit High-Precision Voltage Detector(檢測范圍1.4 V±2.0%，內(nèi)置延時(shí)電路高精度電壓檢測器) |
| S-80915 | 1.5 V±2.0% Bulit-In Delay Circuit High-Precision Voltage Detector(檢測范圍1.5 V±2.0%，內(nèi)置延時(shí)電路高精度電壓檢測器) |
| S-80916 | 1.6 V±2.0% Bulit-In Delay Circuit High-Precision Voltage Detector(檢測范圍1.6 V±2.0%，內(nèi)置延時(shí)電路高精度電壓檢測器) |
| S-80917 | 1.7 V±2.0% Bulit-In Delay Circuit High-Precision Voltage Detector(檢測范圍1.7 V±2.0%，內(nèi)置延時(shí)電路高精度電壓檢測器) |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| S-80913CLMC-G6HT2G | 功能描述:電壓監(jiān)測器/監(jiān)控器 1.3V 1.2uA CMOS Out RoHS:否 制造商:Texas Instruments 監(jiān)測電壓數(shù):2 監(jiān)測電壓:Adjustable 輸出類型:Open Drain 欠電壓閾值: 過電壓閾值: 準(zhǔn)確性:1 % 工作電源電壓:1.5 V to 6.5 V 工作電源電流:1.8 uA 最大工作溫度:+ 125 C 封裝 / 箱體:SON-6 安裝風(fēng)格:SMD/SMT |
| S-80913CLNB-G6HT2G | 功能描述:電壓監(jiān)測器/監(jiān)控器 1.3V 1.2uA CMOS Out RoHS:否 制造商:Texas Instruments 監(jiān)測電壓數(shù):2 監(jiān)測電壓:Adjustable 輸出類型:Open Drain 欠電壓閾值: 過電壓閾值: 準(zhǔn)確性:1 % 工作電源電壓:1.5 V to 6.5 V 工作電源電流:1.8 uA 最大工作溫度:+ 125 C 封裝 / 箱體:SON-6 安裝風(fēng)格:SMD/SMT |
| S-80913CLPF-G6HTFG | 功能描述:電壓監(jiān)測器/監(jiān)控器 Voltage Detect with External Delay 1.0uA RoHS:否 制造商:Texas Instruments 監(jiān)測電壓數(shù):2 監(jiān)測電壓:Adjustable 輸出類型:Open Drain 欠電壓閾值: 過電壓閾值: 準(zhǔn)確性:1 % 工作電源電壓:1.5 V to 6.5 V 工作電源電流:1.8 uA 最大工作溫度:+ 125 C 封裝 / 箱體:SON-6 安裝風(fēng)格:SMD/SMT |
| S-80913CNMC-G8HT2G | 功能描述:電壓監(jiān)測器/監(jiān)控器 1.3V 1.2uA N-Ch Open RoHS:否 制造商:Texas Instruments 監(jiān)測電壓數(shù):2 監(jiān)測電壓:Adjustable 輸出類型:Open Drain 欠電壓閾值: 過電壓閾值: 準(zhǔn)確性:1 % 工作電源電壓:1.5 V to 6.5 V 工作電源電流:1.8 uA 最大工作溫度:+ 125 C 封裝 / 箱體:SON-6 安裝風(fēng)格:SMD/SMT |
| S-80913CNMC-G8HT2U | 功能描述:IC VOLT DETECTOR 1.3V SOT23-5 制造商:ablic u.s.a. inc. 系列:S-809xxC 包裝:剪切帶（CT） 零件狀態(tài):在售 類型:電壓檢測器 受監(jiān)控電壓數(shù):1 輸出:開路漏極或開路集電極 復(fù)位:低有效 復(fù)位超時(shí):最小為 2.7 ms 電壓 - 閾值:1.3V 工作溫度:-40°C ~ 85°C（TA） 安裝類型:表面貼裝 封裝/外殼:SC-74A，SOT-753 供應(yīng)商器件封裝:SOT-23-5 標(biāo)準(zhǔn)包裝:1 |
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。