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參數(shù)資料
| 型號： | RH117MH |
| 廠商： | LINEAR TECHNOLOGY CORP |
| 元件分類： | 可調(diào)正電壓單路輸出標(biāo)準(zhǔn)穩(wěn)壓器 |
| 英文描述： | 1.2 V-37 V ADJUSTABLE POSITIVE REGULATOR, MBCY3 |
| 封裝： | METAL CAN, TO-39, 3 PIN |
| 文件頁數(shù)： | 3/4頁 |
| 文件大?。?/td> | 139K |
| 代理商： | RH117MH |
3
RH117
SYMBOL
PARAMETER
CONDITIONS
NOTES
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
UNITS
IADJ
Adjust Pin Current
100
mA
DIADJ
Adjust Pin Current
10mA
IOUT IMAX
55
5
mA
Change
3V
(VIN – VOUT ) 40V,
5
mA
IOUT = 10mA
IMIN
Minimum Load
(VIN – VOUT ) = 40V
5
mA
Current
Current Limit
(VIN – VOUT )
15V
H Package
0.5
A
K Package
1.5
A
(VIN – VOUT ) = 40V
H Package
0.15
A
K Package
0.30
A
100KRAD(Si)
50KRAD(Si)
20KRAD(Si)
10KRAD(Si)
TABLE 1A: ELECTRICAL CHARACTERISTICS (Postirradiation) (Note 5)
Note 1: Unless otherwise specified, these specifications apply for
VIN – VOUT = 5V; and IOUT = 0.1A for the H package (TO-39) and
IOUT = 0.5A for the K package (TO-3) package. Although power dissipation
is internally limited, these specifications are applicable for power
dissipations of 2W for the TO-39 and 20W for the TO-3. IMAX is 0.5A for
the TO-39 and 1.5A for the TO-3.
Note 2: Regulation is measured at a constant junction temperature using
pulse testing with a low duty cycle. Changes in output voltage due to
heating effects are covered under the specification for thermal regulation.
Note 3: Guaranteed by design, characterization or correlation to other
tested parameters.
Note 4: TJ = 25
∞C unless otherwise noted.
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.
However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen-
tation that the interconnection of its circuits as described herein will not infringe on existing patent rights.
TOTAL DOSE BIAS CIRCUIT
MIL-STD-883 TEST REQUIREMENTS
SUBGROUP
Final Electrical Test Requirements (Method 5004)
1*,2,3
Group A Test Requirements (Method 5005)
1,2,3
Group C and D End Point Electrical Parameters
1
(Method 5005)
* PDA Applies to subgroup 1. See PDA Test Notes.
PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1,
tests after cooldown as the final electrical test in accordance with method
5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup
1, after burn-in divided by the total number of devices submitted for burn-
in in that lot shall be used to determine the percent for the lot.
Linear Technology Corporation reserves the right to test to tighter limits
than those given.
TABLE 2: ELECTRICAL TEST REQUIRE E TS
UW
RH117
VIN
2k
61.9
W
0.1
mF
ADJ
–15V
RH117 TA01
OUTPUT
15V
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