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AS_2.4GHz 3225BPF_A0_05 
Sep.-2001 
RELIABILITY TEST 
n 
Mechanical performance 
Test item 
Solderability 
Test condition / Test method 
Specification 
Solder temp.  
: 235 
±
 5
°
C 
Immersion time: 2 
±
 1 sec 
Solder: SN63 
At least 95% of a surface of 
each terminal electrode must 
be covered by fresh solder. 
Resistance to soldering heat 
Solder: Sn63 
Preheating temperature: 150 
±
 10
°
C 
Solder Temperature: 260 
±
 5
°
C 
Immersion time: 10 
±
 1 sec 
Measurement to be made after keeping at room 
temp. for 24
±
2 hrs. 
No mechanical damage. 
Ceramic surface shall not be 
exposed in the middle of the 
termination or on the 
terminated product edge by 
leaching. 
Drop Test 
Height   : 75 cm 
Direction : 3 directions 
Times   : 3 times for each direction. 
No mechanical damage. 
Samples shall satisfy electrical 
specification after test. 
n 
Environmental characteristics 
Test item 
Humidity (steady conditions) 
Test condition / Test method 
Humidity:90% to 95% R.H. 
Specification 
Tempertaure:40
±
2
°
C 
Time: 500
±
24 hours. 
Measurement: After placing for 24 hours Minimum. 
No mechanical damage. 
Samples shall satisfy electrical 
specification after test. 
Temperature cycle 
1. 30
±
3 minutes at -40
°
C
±
3
°
C, 
2. 10~15 minutes at room temperature, 
3. 30
±
3 minutes at +85
°±
3
°
C, 
4. 10~15 minutes at room temperature, 
Total 100 continuous cycles 
Measurement after placing for 48
±
2 hrs min. 
No mechanical damage. 
Samples shall satisfy electrical 
specification after test. 
High temperature 
Temperature: 85
°
C
±
2
°
C 
Test duration: 24 hours 
Measurement must be taken after subjection to the 
above conditions, followed by exposure in room 
environment for 1 to 2 hours. 
No mechanical damage. 
Samples shall satisfy electrical 
specification after test. 
Low temperature  
Temperature: -40
°
C
±
3
°
C 
Test duration: 24 hours 
Measurement must be taken after subjection to the 
above conditions, followed by exposure in room 
environment for 1 to 2 hours. 
No mechanical damage. 
Samples shall satisfy electrical 
specification after test.