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RC4277
PRODUCT SPECIFICATION
3
Electrical Characteristics
(V
S
=
±
15V, and T
A
= +25
°
C unless otherwise noted)
Notes:
1. Long Term Input Offset Voltage Stability refers to the averaged trend line of VOS vs. Time over extended periods after the
first 30 days of operation. Excluding the initial hour of operation, changes in VOS during the first 30 operating days are
typically 2.5
m
V.
2. Guaranteed by design.
3. Input Offset Voltage measurements are performed by automated test equipment approximately 0.5 seconds after application
of power.
4. The input protection diodes do not allow the device to be removed or inserted into the circuit without first removing power.
Parameters
Input Offset Voltage
3
Input Voltage Offset Match
Long Term V
OS
Stability
1
Input Offset Current
Input Bias Current
Input Noise Voltage
Input Noise Voltage Density
Test Conditions
Min
Typ
30
25
0.3
0.5
±
0.5
0.35
10.3
10
9.6
0.32
0.14
0.12
±
14
132
132
350
±
13
±
12.8
±
12
0.3
0.8
60
60
155
Max
75
150
Units
m
V
m
V
m
V/Mo
nA
nA
m
V
p-p
5.0
±
5.0
0.1 Hz to 10 Hz
F
O
= 10 Hz
F
O
= 100 Hz
F
O
= 1000 Hz
F
O
= 10 Hz
F
O
= 100 Hz
F
O
= 1000 Hz
Input Noise Current Density
Input Voltage Range
2, 4
Common Mode Rejection Ratio
Power Supply Rejection Ratio
Large Signal Voltage Gain
Output Voltage Swing
±
11
110
110
1300
±
12.5
±
12
±
11
0.1
V
dB
dB
V
CM
=
±
11V
V
S
=
±
4V to
±
16.5V
R
L
3
2k
W
, V
OUT
=
±
10V
R
L
3
10k
W
R
L
3
2k
W
R
L
3
1k
W
R
L
3
2k
W
A
VCL
= +1.0
V
OUT
= 0, I
OUT
= 0
V
S
=
±
15V, R
L
=
¥
V/mV
V
Slew Rate
Closed Loop Bandwidth
Open Loop Output Resistance
Power Consumption
Crosstalk
V/
m
s
MHz
W
100
mW
dB
126
Hz
--nV
Hz
--pA