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參數(shù)資料
| 型號： | Q67060-S6504-A5 |
| 廠商： | INFINEON TECHNOLOGIES AG |
| 英文描述： | HITFET II.Generation BTS 134 D |
| 中文描述： | HITFET II.Generation基站134? |
| 文件頁數(shù)： | 10/10頁 |
| 文件大?。?/td> | 359K |
| 代理商： | Q67060-S6504-A5 |
Page 10
2004-03-05
BTS 134D
Revision History :
Previous version :
2004-03-05
2003-04-22
For questions on technology, delivery and prices please contact the Infineon Technologies Offices in Germany
or the Infineon Technologies Companies and Representatives worldwide: see our webpage at
http://www.infineon.com
HITFET
, SIPMOS
are registered trademarks of Infineon Technologies AG.
Edition 2004-02-02
Published by Infineon Technologies AG,
St.-Martin-Strasse 53,
D-81541 München, Germany
Infineon Technologies AG 2001
All Rights Reserved.
Attention please!
The information herein is given to describe certain components and shall not be considered as a guarantee
of characteristics.
Terms of delivery and rights to technical change reserved.
We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement,
regarding circuits, descriptions and charts stated herein.
Infineon Technologies is an approved CECC manufacturer.
Information
For further information on technology, delivery terms and conditions and prices please contact your
nearest Infineon Technologies Office in Germany or our Infineon Technologies Representatives worldwide
(see address list).
Warnings
Due to technical requirements components may contain dangerous substances. For information on the
types in question please contact your nearest Infineon Technologies Office.
Infineon Technologies Components may only be used in life-support devices or systems with the express
written approval of Infineon Technologies, if a failure of such components can reasonably be expected to
cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device
or system. Life support devices or systems are intended to be implanted in the human body, or to support
and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health
of the user or other persons may be endangered.
Page
2, 4
2, 3
2
Subjects (major changes since last revision)
Footnote 2 extended to Vin<0V, E
tot
and
T
jT
Footnote 5 implemented to P
tot
, I
D(nom)
and I
D(ISO)
ESD test condition changed from MIL STD 883D, methode 3015.7 and EOS/ESD assn.
standard S5.1-1993 to Jedec Norm EIA/JESD22-A114-B, Section 4
Humidity category classification changed from DIN 40040 value E to J-STD-20-B value MSL1
climatic category changed from DIN IEC 68-1 to DIN EN 60068-1
V
IN(th)
test conditions from
I
D
=0.7mA to
I
D
=1.4mA
2
2
3
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