參數(shù)資料
型號: PUMA77S16000A-025
英文描述: 10NS, 100 TQFP, IND TEMP(EPLD)
中文描述: 靜態(tài)存儲器| 512KX32 |的CMOS | QFP封裝| 68PIN |陶瓷
文件頁數(shù): 10/10頁
文件大?。?/td> 196K
代理商: PUMA77S16000A-025
Military Screening Procedure
MultiChip Screening Flow for high reliability product in accordance with Mil-883 method 5004 shown below
Visual and Mechanical
Internal visual
2017 Condition B or manufacturers equivalent
100%
Temperature cycle
1010 Condition B (10 Cycles,-55°C to +125°C)
100%
Constant acceleration
2001 Condition E (Y
1 only) (10,000g)
100%
Burn-In
Pre-Burn-in electrical
Per applicable device specifications at T
A=+25
°C
100%
Burn-in
Method 1015,Condition D,T
A=+125
°C,160hrs min
100%
Final Electrical Tests
Per applicable Device Specification
Static (dc)
a) @ T
A=+25
°C and power supply extremes
100%
b) @ temperature and power supply extremes
100%
Functional
a) @ T
A=+25
°C and power supply extremes
100%
b) @ temperature and power supply extremes
100%
Switching (ac)
a) @ T
A=+25
°C and power supply extremes
100%
b) @ temperature and power supply extremes
100%
Percent Defective allowable (PDA)
Calculated at post burn-in at T
A=+25
°C
10%
Hermeticity
1014
Fine
Condition A
100%
Gross
Condition C
100%
Quality Conformance
Per applicable Device Specification
Sample
External Visual
2009 Per vendor or customer specification
100%
SCREEN
TEST METHOD
LEVEL
MB MULTICHIP MODULE SCREENING FLOW
相關(guān)PDF資料
PDF描述
PUMA77S16000A-35 x32 SRAM Module
PUMA77S16000A-45 10NS, 44 PLCC, COM TEMP(EPLD)
PUMA77S16000AMB-45 x32 SRAM Module
PUMA77S16000AMB-55 25NS, 68 PLCC, IND TEMP(EPLD)
PUMA77S16000I-020 25NS, 100 PQFP, IND TEMP(EPLD)
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