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參數(shù)資料
| 型號： | PO74G00ASR |
| 廠商： | Electronic Theatre Controls, Inc. |
| 英文描述： | 54, 74 Series GHz Logic |
| 中文描述： | 54，74系列GHz的邏輯 |
| 文件頁數(shù)： | 2/6頁 |
| 文件大小： | 468K |
| 代理商： | PO74G00ASR |
Maximum Ratings
DC Electrical Characteristics
Symbol
Description
Test Conditions
Min
Typ
Max
Unit
V
OH
Output High voltage
Vcc=3V Vin=V
IH
or V
IL
, I
OH
= -12mA
2.4
3
-
V
V
OL
Output Low voltage
Vcc=3V Vin=V
IH
or V
IL
, I
OH
=12mA
-
0.3
0.5
V
V
IH
Input High voltage
Guaranteed Logic HIGH Level (Input Pin)
2
-
5.5
V
V
IL
Input Low voltage
Guaranteed Logic LOW Level (Input Pin)
-0.5
-
0.8
V
I
IH
Input High current
Vcc = 3.6V and Vin = 5.5V
-
-
5 uA
I
IL
Input Low current
Vcc = 3.6V and Vin = 0V
-
-
-5 uA
V
IK
Clamp diode voltage
Vcc = Min. And
I
IN
= -18mA
-
-0.7
-1.2
V
Notes:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2.
Typical values are at Vcc = 3.3V, 25
°
C ambient.
3.
This parameter is guaranteed but not tested.
4.
Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
5.
VoH = Vcc – 0.6V at rated current
Description
Max
Unit
Storage Temperature
-65 to 150
°
C
Operation Temperature
-55 to 125
°
C
Operation Voltage
-0.5 to +4.6
V
Input Voltage
-0.5 to +5.5
V
Output Voltage
-0.5 to Vcc+0.5
V
Note:
stresses greater than listed under
Maximum
Ratings
permanent damage to the device. This
is a stress rating only and functional
operation of the device at these or any
other conditions above those indicated
in the operational sections of this
specification is not implied. Exposure
to absolute maximum rating conditions
for extended periods may affect
reliability specification is not implied.
may
cause
2
Copyright
2005-2007, Potato Semiconductor Corporation
54, 74 Series GHz Logic
PO54G00A, PO74G00A
QUADRUPLE 2-INPUT POSITIVE-NAND GATE
09/12/07
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