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參數(shù)資料
型號(hào): PK30N512VLL100
廠商: Freescale Semiconductor
文件頁(yè)數(shù): 14/66頁(yè)
文件大?。?/td> 0K
描述: IC ARM CORTEX MCU 512K 100-LQFP
產(chǎn)品培訓(xùn)模塊: Kinetis® Cortex-M4 Microcontroller Family
標(biāo)準(zhǔn)包裝: 1
系列: Kinetis
核心處理器: ARM? Cortex?-M4
芯體尺寸: 32-位
速度: 100MHz
連通性: CAN,I²C,IrDA,SDHC,SPI,UART/USART
外圍設(shè)備: DMA,I²S,LCD,LVD,POR,PWM,WDT
輸入/輸出數(shù): 66
程序存儲(chǔ)器容量: 512KB(512K x 8)
程序存儲(chǔ)器類型: 閃存
RAM 容量: 128K x 8
電壓 - 電源 (Vcc/Vdd): 1.71 V ~ 3.6 V
數(shù)據(jù)轉(zhuǎn)換器: A/D 30x16b,D/A 1x12b
振蕩器型: 內(nèi)部
工作溫度: -40°C ~ 105°C
封裝/外殼: 100-LQFP
包裝: 托盤
5.4.1 Thermal operating requirements
Table 11. Thermal operating requirements
Symbol
Description
Min.
Max.
Unit
TJ
Die junction temperature
–40
125
°C
TA
Ambient temperature
–40
105
°C
5.4.2 Thermal attributes
Board type
Symbol
Description
100 LQFP
Unit
Notes
Single-layer (1s)
RθJA
Thermal
resistance, junction
to ambient (natural
convection)
47
°C/W
Four-layer (2s2p)
RθJA
Thermal
resistance, junction
to ambient (natural
convection)
35
°C/W
Single-layer (1s)
RθJMA
Thermal
resistance, junction
to ambient (200 ft./
min. air speed)
37
°C/W
Four-layer (2s2p)
RθJMA
Thermal
resistance, junction
to ambient (200 ft./
min. air speed)
29
°C/W
RθJB
Thermal
resistance, junction
to board
20
°C/W
RθJC
Thermal
resistance, junction
to case
9
°C/W
ΨJT
Thermal
characterization
parameter, junction
to package top
outside center
(natural
convection)
2
°C/W
1.
Determined according to JEDEC Standard JESD51-2, Integrated Circuits Thermal Test Method Environmental
Conditions—Natural Convection (Still Air), or EIA/JEDEC Standard JESD51-6, Integrated Circuit Thermal Test Method
Environmental Conditions—Forced Convection (Moving Air).
2.
Determined according to JEDEC Standard JESD51-8, Integrated Circuit Thermal Test Method Environmental
Conditions—Junction-to-Board.
3.
Determined according to Method 1012.1 of MIL-STD 883, Test Method Standard, Microcircuits, with the cold plate
temperature used for the case temperature. The value includes the thermal resistance of the interface material
between the top of the package and the cold plate.
4.
Determined according to JEDEC Standard JESD51-2, Integrated Circuits Thermal Test Method Environmental
Conditions—Natural Convection (Still Air).
General
K30 Sub-Family Data Sheet Data Sheet, Rev. 7, 02/2013.
Freescale Semiconductor, Inc.
21
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