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鏂囦欢闋�(y猫)鏁�(sh霉)锛� 29/75闋�(y猫)
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Table 23. NVM reliability specifications (continued)
Symbol
Description
Min.
Typ.1
Max.
Unit
Notes
tnvmretp10k Data retention after up to 10 K cycles
5
50
鈥�
years
tnvmretp1k Data retention after up to 1 K cycles
20
100
鈥�
years
nnvmcycp Cycling endurance
10 K
50 K
鈥�
cycles
1. Typical data retention values are based on measured response accelerated at high temperature and derated to a constant
25掳C use profile. Engineering Bulletin EB618 does not apply to this technology. Typical endurance defined in Engineering
Bulletin EB619.
2. Cycling endurance represents number of program/erase cycles at -40掳C 鈮� Tj 鈮� 125掳C.
6.4.2 EzPort Switching Specifications
Table 24. EzPort switching specifications
Num
Description
Min.
Max.
Unit
Operating voltage
1.71
3.6
V
EP1
EZP_CK frequency of operation (all commands except
READ)
鈥�
fSYS/2
MHz
EP1a
EZP_CK frequency of operation (READ command)
鈥�
fSYS/8
MHz
EP2
EZP_CS negation to next EZP_CS assertion
2 x tEZP_CK
鈥�
ns
EP3
EZP_CS input valid to EZP_CK high (setup)
5
鈥�
ns
EP4
EZP_CK high to EZP_CS input invalid (hold)
5
鈥�
ns
EP5
EZP_D input valid to EZP_CK high (setup)
2
鈥�
ns
EP6
EZP_CK high to EZP_D input invalid (hold)
5
鈥�
ns
EP7
EZP_CK low to EZP_Q output valid
鈥�
16
ns
EP8
EZP_CK low to EZP_Q output invalid (hold)
0
鈥�
ns
EP9
EZP_CS negation to EZP_Q tri-state
鈥�
12
ns
Peripheral operating requirements and behaviors
K20 Sub-Family Data Sheet Data Sheet, Rev. 7, 02/2013.
Freescale Semiconductor, Inc.
35
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