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鍙冩暩(sh霉)璩囨枡
鍨嬭櫉(h脿o)锛� PIC18F4480-I/P
寤犲晢锛� Microchip Technology
鏂囦欢闋佹暩(sh霉)锛� 66/88闋�
鏂囦欢澶�?銆�?/td> 0K
鎻忚堪锛� IC PIC MCU FLASH 8KX16 40DIP
鐢�(ch菐n)鍝佸煿瑷�(x霉n)妯″锛� Asynchronous Stimulus
PIC18 J Series MCU Overview
8-bit PIC® Microcontroller Portfolio
妯�(bi膩o)婧�(zh菙n)鍖呰锛� 10
绯诲垪锛� PIC® 18F
鏍稿績铏曠悊鍣細 PIC
鑺珨灏哄锛� 8-浣�
閫熷害锛� 40MHz
閫ｉ€氭€э細 CAN锛孖²C锛孲PI锛孶ART/USART
澶栧湇瑷�(sh猫)鍌欙細 娆犲妾㈡脯(c猫)/寰�(f霉)浣�锛孒LVD锛孭OR锛孭WM锛學DT
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绋嬪簭瀛樺劜(ch菙)鍣ㄩ鍨嬶細 闁冨瓨
EEPROM 澶�?銆�?/td> 256 x 8
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闆诲 - 闆绘簮 (Vcc/Vdd)锛� 4.2 V ~ 5.5 V
鏁�(sh霉)鎿�(j霉)杞�(zhu菐n)鎻涘櫒锛� A/D 11x10b
鎸暕鍣ㄥ瀷锛� 鍏�(n猫i)閮�
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灏佽/澶栨锛� 40-DIP锛�0.600"锛�15.24mm锛�
鍖呰锛� 绠′欢
鐢�(ch菐n)鍝佺洰閷勯爜闈細 645 (CN2011-ZH PDF)
閰嶇敤锛� DVA18XP400-ND - DEVICE ADAPTER 18F4220 PDIP 40LD
444-1001-ND - DEMO BOARD FOR PICMICRO MCU
ACICE0206-ND - ADAPTER MPLABICE 40P 600 MIL
2010 Microchip Technology Inc.
DS21801F-page 69
MCP2515
13.0
ELECTRICAL CHARACTERISTICS
13.1
Absolute Maximum Ratings
V
DD............................................................................................................................................................................. 7.0V
All inputs and outputs w.r.t. VSS ..........................................................................................................-0.6V to VDD +1.0V
Storage temperature ............................................................................................................................... -65掳C to +150掳C
Ambient temperature with power applied................................................................................................-65掳C to +125掳C
Soldering temperature of leads (10 seconds) ....................................................................................................... +300掳C
Notice: Stresses above those listed under 鈥淢aximum Ratings鈥� may cause permanent damage to the device. This
is a stress rating only and functional operation of the device at those or any other conditions above those indicated in
the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods
may affect device reliability.
鐩搁棞(gu膩n)PDF璩囨枡
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鍙冩暩(sh霉)鎻忚堪
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