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| 型號(hào)： | PI3B34X245B |
| 英文描述： | 3.3V Low Power EIA/TIA562 Transceiver; Package: SO; No of Pins: 16; Temperature Range: 0°C to +70°C |
| 中文描述： | 總線開關(guān) |
| 文件頁(yè)數(shù)： | 3/4頁(yè) |
| 文件大?。?/td> | 184K |
| 代理商： | PI3B34X245B |
PI3B3125/PI3B3126
3.3V, Hot Insertion, 4-Bit,
2-Port BusSwitch
3
PS8153D 01/05/00
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Capacitance
(T
A
= 25°C, f = 1 MHz)
Parameters
(4)
C
IN
C
OFF
Description
Input Capacitance
A/B Capacitance, Switch Off
Test Conditions
V
IN
= 0V
V
IN
= 0V
Typ.
3.5
8
Units
pF
pF
Power Supply Characteristics
Parameters Description
Test Conditions
(1)
Min.
Typ.
(2)
Max.
Units
I
CC
Quiescent Power
Supply Current
V
CC
= Max.
V
IN
= GND or V
CC
0.1
3
μA
I
CC
Supply Current per
Input HIGH
V
CC
= Max.
V
IN
= 3.0V
(3)
750
μA
DC Electrical Characteristics
(Over the Operating Range, T
A
= –40°C to +85°C, V
CC
= 3.3V ±10%)
Parameters Description
V
IH
Test Conditions
(1)
Guaranteed Logic HIGH Level
Min.
2.0
Typ.
(2)
Max.
Units
V
Input HIGH Voltage
V
IL
Input LOW Voltage
Guaranteed Logic LOW Level
–0.5
0.8
V
I
IH
Input HIGH Current
V
CC
= Max., V
IN
= V
CC
±1
μA
I
IL
Input LOW Current
V
CC
= Max., V
IN
= GND
±1
μA
I
OFF
Off Current
V
CC
= 0, V
OUT
= 3 to 3.6V
10
μA
V
IK
Clamp Diode Voltage
Switch On Resistance
(3)
V
CC
= Min., I
IN
= –18mA
–1.2
V
R
ON
V
CC
= Min., V
IN
= 0.0V, I
ON
= 48mA or 60mA
V
CC
= Min., V
IN
= 2.4V, I
ON
= 15mA
5
8
10
17
Notes:
1. For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device.
2. Typical values are at V
CC
= 3.3V, +25°C ambient.
3. Per driven input (control inputs only); A and B pins do not contribute to I
CC
.
Notes:
1. For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 3.3V, T
A
= 25°C ambient and maximum loading.
3. Measured by the voltage drop between A and B pin at indicated current through the switch. ON resistance is determined by the
lower of the voltages on the two (A, B) pins.
4. This parameter is determined by device characterization but is not production tested.
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