參數(shù)資料
型號(hào): PEEL16CV8P-25
英文描述: CMOS Programmable Electrically Erasable Logic Device
中文描述: 的CMOS電可擦除可編程邏輯器件
文件頁(yè)數(shù): 9/11頁(yè)
文件大?。?/td> 386K
代理商: PEEL16CV8P-25
Anachip Corp.
www.anachip.com.tw Rev. 1.0 Dec 16, 2004
9/11
A. C. Electrical Characteristics
Over
the Operating Range 8, 11
Symbol
Parameter
t
PD
Input
5
to non-registered output
t
OE
Input
5
to output enable
t
OD
Input
5
to output disable
6
t
CO1
Clock to Output
t
CO2
Clock to comb. Output delay
Via internal registered feedback
t
CF
Clock to Feedback
t
SC
Input
or feedback setup to clock
t
HC
Input
5
hold after clock
t
CL, tCH
Clock low time, clock high time
8
t
CP
Min clock period Ext (t
SC
+ t
CO1
)
f
MAX1
Internal feedback (1/t
SC
+t
CF
)
f
MAX2
External Feedback (1/t
CP
)
11
f
MAX3
No Feedback (1/t
CL
+t
CH
)
11
t
AW
Asynchronous Reset Pulse Width
t
AP
Input
to Asynchronous Reset
t
AR
Asynchronous Reset recovery time
t
RESET
Power-on reset time for registers in clear
state
Min
Max
25
25
25
15
Unit
ns
ns
ns
ns
35
ns
10
25
25
ns
ns
ns
ns
ns
MHz
MHz
MHz
ns
ns
ns
20
0
15
35
28.5
28.5
33.3
25
5
μs
Switching Waveforms
Inputs, I/O,
Registered Feedback,
Synchronous Preset
Clock
Asynchronous
Reset
Registered
Outputs
Combinatorial
Outputs
Notes:
1. Minimum DC
input
is
-0.5V,
however, inputs may undershoot to -2.0V for
periods less than
20 ns.
2. V
I
and V
O
are not specified for
program/verify operation.
3.
Test Points for Clock and VCC
in t
R
and
t
F
are referenced
at the
10% and 90% levels.
4.
I/O
pins are 0V and
V
CC
.
5.
“Input”
refers to an input pin signal.
6. t
OE
is measured from input transition to V
REF
±0.1V, T
OD
is measured from
input transi- tion
to V
OH
-0.1V or
V
OL
+0.1V; V
REF
=V
L.
7.
Capacitances are tested on a sample basis.
8. Test conditions
assume:
signal
transition times of 3ns
or
less from the
10% and 90%
points, timing reference levels of
1.5V (Unless
otherwise
specified).
9.
Test one output at a time for a duration of less
than 1
second.
10. I
CC
for
a typical
application: This parameter is tested with the device programmed as an
8-bit Counter.
11. Parameters are
not 100%
tested. Specifications
are based
on initial characterization and
are
tested after
any design
process
modification that might affect operational fre- quency.
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