參數(shù)資料
型號: P4C1024L-45C4MB
廠商: PYRAMID SEMICONDUCTOR CORP
元件分類: SRAM
英文描述: 128K X 8 STANDARD SRAM, 45 ns, CDIP32
封裝: 0.400 INCH, SIDE BRAZED, CERAMIC, DIP-32
文件頁數(shù): 9/14頁
文件大?。?/td> 152K
代理商: P4C1024L-45C4MB
P4C1024
Page 4 of 14
Document # SRAM124 REV A
AC ELECTRICAL CHARACTERISTICS—READ CYCLE
(V
CC = 5V ± 10%, All Temperature Ranges)
(2)
Min Max Min Max Min Max Min Max Min Max Min Max Min Max Min Max Min Max Min Max
tRC
Read Cycle
Time
15
20
25
35
45
55
70
85
100
120
ns
tAA
Address
Access Time
15
20
25
35
45
55
70
85
100
120
ns
tAC
Chip Enable
Access Time
15
20
25
35
45
55
70
85
100
120
ns
tOH
Output Hold
from Address
Change
333333333
3
ns
tLZ
Chip Enable to
Output in Low Z
333333333
3
ns
tHZ
Chip Disable
to Output in
High Z
8
9
11
15
20
25
30
35
40
50
ns
tOE
Output Enable
Low to Data
Valid
7
9
11
15
20
25
30
35
40
50
ns
tOLZ
Output Enable
Low to Low Z
000000000
0
ns
tOHZ
Output Enable
High to High Z
7
9
11
15
20
25
30
35
40
50
ns
tPU
Chip Enable to
Power Up
Time
000000000
0
ns
tPD
Chip Disable
to Power Down
Time
12
20
25
30
35
40
45
50
ns
Symbol
Parameter
-15
-20
-25
-35
-45
Unit
-55
-70
-85
-100
-120
Notes:
5.
WE is HIGH for READ cycle.
6.
CE
1 is LOW, CE2 is HIGH and OE is LOW for READ cycle.
7. ADDRESS must be valid prior to, or coincident with
CE
1 transition
LOW and CE
2 transition HIGH.
8. Transition is measured ± 200 mV from steady state voltage prior to
change, with loading as specified in Figure 1. This parameter is
sampled and not 100% tested.
TIMING WAVEFORM OF READ CYCLE NO. 1 (
OE
OE CONTROLLED)(5)
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