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參數(shù)資料
| 型號： | P2532-01 |
| 廠商： | Hamamatsu Photonics |
| 英文描述： | KPSE 7C 7#20 PIN PLUG |
| 中文描述： | 硫化鉛光電探測器 |
| 文件頁數(shù)： | 2/4頁 |
| 文件大小： | 82K |
| 代理商： | P2532-01 |
PbS photoconductive detector
P2532-01, P2682-01
ELEMENT TEMPERATURE
(
C)
R
(Typ.)
10
1
10
2
-20
10
3
-10
0
10
20
30
40
50
60
LIGHT SOURCE: BLACK BODY 500 K
INCIDENT ENERGY: 4.8 μW/cm
2
CHOPPING FREQUENCY: 600 Hz
SUPPLY VOLTAGE: 15 V
R
INCIDENT ENERGY (W/cm
2
)
(Typ. Ta=25
C, FULLY ILLUMINATED)
10
-3
10
-2
10
-1
10
0
10
1
10
2
10
-9
10
-8
10
-7
10
-6
10
-5
10
-4
DEPENDENT ON NEP
ELEMENT TEMPERATURE
(
C)
R
(Typ.)
10
1
10
2
10
3
-10
0
10
20
30
40
50
60
-20
RISE TIME
DARK RESISTANCE
CHOPPING FREQUENCY (Hz)
R
S
(Typ. Ta=25
C)
10
1
10
2
10
3
10
1
10
2
10
3
LIGHT SOURCE: BLACK BODY 500 K
INCIDENT ENERGY: 4.8 μW/cm
2
SUPPLY VOLTAGE: 15 V
tr: 200 μs
S/N
S
N
SUPPLY VOLTAGE
(V)
S
N
10
20
30
40
50
60
(Typ. Ta=25
C)
0
0
0
200
400
600
800
2
4
6
8
1
3
5
7
NOISE
SIGNAL
LIGHT SOURCE: BLACK BODY 500 K
INCIDENT ENERGY: 4.8 μW/cm
2
CHOPPING FREQUENCY: 600 Hz
FREQUENCY BANDWIDTH: 60 Hz
I
Spectral response
KIRDB0279EA
I
S/N vs. supply voltage
I
S/N vs. chopping frequency
I
Photo sensitivity temperature characteristic
I
Dark resistance, rise time temperature characteristics
I
Photo sensitivity linearity
KIRDB0046EA
KIRDB0048EB
KIRDB0047EB
KIRDB0049EB
KIRDB0050EA
Increasing the chopping frequency re-
duces the 1/f noise and results in an S/N
improvement. The S/N can also be im-
proved by narrowing the noise bandwidth
using a lock-in amplifier.
By making the incident light spot smaller
than the active area, the upper limit of
the linearity becomes lower.
If voltage of higher than 60 V is applied,
the noise increases exponentially, de-
grading the S/N. The device should be
operated at 60 V or less.
Cooling the device enhances its sensi-
tivity, but the sensitivity also depends
on the load resistance in the circuit.
2
WAVELENGTH
(μm)
(Typ.)
1
4
2
3
5
0
20
40
60
80
100
R
-20
C
-10
C
25
C
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| P2532-1 | 制造商:Everett Charles Technologies (ECT) 功能描述:TEST SPRING PROBE 5A 制造商:EVERETT CHARLES TECH 功能描述:TEST SPRING PROBE, 5A 制造商:EVERETT CHARLES TECH 功能描述:TEST SPRING PROBE, PCB, SOLDER; Connector Tip Style:Radius; Current Rating:5A; Overall Length:20.62mm; Spring Force Initial:1oz; Spring Force Working Travel:3oz; Body Material:Brass; Connector Type:Test Point; Contact Plating:Gold ;RoHS Compliant: Yes |
| P2532-1 | 制造商:Everett Charles Technologies (ECT) 功能描述:TEST SPRING PROBE |
| P2532-2 | 制造商:Everett Charles Technologies (ECT) 功能描述:Test Spring Probe 制造商:EVERETT CHARLES TECH 功能描述:TEST SPRING PROBE, PCB, SOLDER; Connector Tip Style:60 Point; Current Rating:5A; Overall Length:20.62mm; Spring Force Initial:1oz; Spring Force Working Travel:3oz; Body Material:Brass; Connector Type:Test Point; Contact Plating:Gold;RoHS Compliant: Yes |
| P253226 | 制造商:Harwin 功能描述:PROBE TAPERED CROWN CONTACT 制造商:Harwin 功能描述:PROBE, TAPERED CROWN CONTACT 制造商:Harwin 功能描述:PROBE, TAPERED CROWN CONTACT; Connector Type:Spring Probe; Series:Tapered Crown; Contact Material:Phosphor Bronze; Current Rating:3A; Contact Plating:Rhodium; SVHC:No SVHC (19-Dec-2012); Fixing Hole Diameter:1.7mm; Initial ;RoHS Compliant: Yes |
| P25-3226 | 功能描述:觸點探頭 2.54mm SPRING PROBE 2 PART CROWN HEAD RoHS:否 制造商:IDI 類型:Probes 尖端類型:Spherical Radius 長度:8.26 mm 電流額定值:10 A 彈力:2.3 oz 行程:1.52 mm 系列:101050 |
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