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鍨嬭櫉(h脿o)锛� P1AFS600-2FGG484
寤犲晢锛� Microsemi SoC
鏂囦欢闋�(y猫)鏁�(sh霉)锛� 140/334闋�(y猫)
鏂囦欢澶�?銆�?/td> 0K
鎻忚堪锛� IC FPGA PIGEON POINT 484-FBGA
妯�(bi膩o)婧�(zh菙n)鍖呰锛� 60
绯诲垪锛� Fusion®
RAM 浣嶇附瑷�(j矛)锛� 110592
杓稿叆/杓稿嚭鏁�(sh霉)锛� 172
闁€(m茅n)鏁�(sh霉)锛� 600000
闆绘簮闆诲锛� 1.425 V ~ 1.575 V
瀹夎椤炲瀷锛� 琛ㄩ潰璨艰
宸ヤ綔婧害锛� 0°C ~ 85°C
灏佽/澶栨锛� 484-BGA
渚涙噳(y墨ng)鍟嗚ō(sh猫)鍌欏皝瑁濓細 484-FPBGA锛�23x23锛�
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Device Architecture
2-208
Revision 4
SSTL2 Class I
Stub-Speed Terminated Logic for 2.5 V memory bus standard (JESD8-9). Fusion devices support Class
I. This provides a differential amplifier input buffer and a push-pull output buffer.
Timing Characteristics
Table 2-156 Minimum and Maximum DC Input and Output Levels
SSTL2 Class I
VIL
VIH
VOL
VOH
IOL IOH IOSL IOSH IIL1 IIH2
Drive
Strength
Min.
V
Max.
V
Min.
V
Max.
V
Max.
V
Min.
VmA mA
Max.
mA3
Max.
mA3 A4 A4
15 mA
鈥�0.3 VREF 鈥� 0.2 VREF + 0.2
3.6
0.54
VCCI 鈥� 0.62 15
15
87
83
10
Notes:
1. IIL is the input leakage current per I/O pin over recommended operation conditions where 鈥�0.3 V < VIN < VIL.
2. IIH is the input leakage current per I/O pin over recommended operating conditions VIH < VIN < VCCI. Input current is
larger when operating outside recommended ranges.
3. Currents are measured at high temperature (100掳C junction temperature) and maximum voltage.
4. Currents are measured at 85掳C junction temperature.
Figure 2-130 AC Loading
Table 2-157 AC Waveforms, Measuring Points, and Capacitive Loads
Input Low (V)
Input High (V)
Measuring Point* (V)
VREF (typ.) (V)
VTT (typ.) (V)
CLOAD (pF)
VREF 鈥� 0.2
VREF + 0.2
1.25
30
Note: *Measuring point = Vtrip. See Table 2-90 on page 2-169 for a complete table of trip points.
Test Point
30 pF
50
25
SSTL2
Class I
VTT
Table 2-158 SSTL 2 Class I
Commercial Temperature Range Conditions: TJ = 70掳C, Worst-Case VCC = 1.425 V,
Worst-Case VCCI = 2.3 V, VREF = 1.25 V
Speed
Grade
tDOUT
tDP
tDIN
tPY
tEOUT
tZL
tZH
tLZ
tHZ
tZLS
tZHS
Units
Std.
0.66
2.13
0.04
1.33
0.43
2.17
1.85
4.40
4.08
ns
鈥�1
0.56
1.81
0.04
1.14
0.36
1.84
1.57
3.74
3.47
ns
鈥�2
0.49
1.59
0.03
1.00
0.32
1.62
1.38
3.29
3.05
ns
Note: For the derating values at specific junction temperature and voltage supply levels, refer to Table 3-7 on
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