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參數(shù)資料
| 型號(hào)： | P172-TYPE |
| 英文描述： | P172-Type Receiver |
| 中文描述： | P172型接收機(jī) |
| 文件頁(yè)數(shù)： | 7/8頁(yè) |
| 文件大?。?/td> | 89K |
| 代理商： | P172-TYPE |
7
Agere Systems Inc.
Advance Data Sheet
August 2001
P172-Type Receiver
Qualification Information
The P172-type receiver is scheduled to complete the following qualification tests and meet the intent of Telcordia
Technologies GR-468-CORE.
Table 4. P172Type Qualification Information
Test
Reference
Conditions
Sample Size
Pass/Fail Criteria
Mechanical Shock
and Vibration
Telcordia Technologies
GR-468-CORE,
Section 8.3.2
500 g, 0.5 ms
Condition A, 20 g,
20 Hz to 2000 Hz,
4 min./cycle,
4 cycles
0
°
C to 100
°
C,
20 cycles
Condition A
11
10% Responsivity
Change After Completion
of Both Tests
Thermal Shock
MIL-STD-883
Method 1011
MIL-STD-883
Method 2004
MIL-STD-883
Method 2003
—
11
Physical Attributes and
Leak Check
—
Lead Integrity
To Be Provided by
the Supplier
To Be Provided by
the Supplier
11
Solderability
—
—
Low Temperature
Storage
–40
°
C storage
2000 hours
10% Responsivity
Change After Completion
of Test
10% Responsivity
Change After Completion
of Test
10% Responsivity
Change After Completion
of Test
10% Responsivity
Change After Completion
of Test
10% Responsivity
Change After Completion
of Test
TelcordiaRequirement
High Temperature
Storage
—
85
°
C storage
2000 hours
11
Temperature
Cycling
Telcordia Technologies
GR-468-CORE,
Section 5.20
MIL-STD-883
Method 103
–40
°
C to +85
°
C,
500 cycles
11
Damp Heat
85
°
C/85% RH
1000 hours
11
Cyclic Moisture
Resistance
Telcordia Technologies
GR-468-CORE,
Section 5.23
Telcordia Technologies
GR-468-CORE,
Section 5.22
MIL-STD-883
Method 1018
—
11
ESD Threshold
—
6
Internal Moisture
—
11 Pieces After
Thermal Shock
Test
Max 5000 ppm Water
Vapor After Other Test
Cells
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