參數(shù)資料
型號: P1100SCRP
英文描述: Flash Microcontroller with Comparator, CCP, & USART., -40C to +85C, 18-SOIC 300mil, T/R
中文描述: SIDAC的| 130V五(公報(bào))最大| 800mA的我(縣)|的DO - 214AA
文件頁數(shù): 87/161頁
文件大?。?/td> 986K
代理商: P1100SCRP
SIDACtor
Data Book
ITU-T K.20 and K.21
Teccor Electronics
(972) 580-7777
4 - 13
R
R
Table 4-10 K.20 Lightning Simulation
Notes:
1. Connection appearances are shown in Figure 4-3
2. This is a simultaneous surge. The specified current is the resultant current (sum of terminal A and
terminal B) with respect to ground (terminal E).
3. The time interval between multiple applications should be 1 minute. In the case of pulse tests, the
polarity should be reversed between consecutive pulses.
Figure 4-3 Connection Appearances
Test
Number
Connection
(Note 1)
Open Circuit
Voltage
(V)
1000
10x700μs
1000
10x700μs
Short Circuit
Current
(A)
25
5x310μs
25
5x310μs
50
5x310μs
(Note 2)
100
5x310μs
100
5x310μs
200
5x310μs
(Note 2)
Number of
Tests
(Note 3)
Added
Protection
Acceptance
Criteria
1
A and E,
B earthed
B and E,
A earthed
10
None
A
2
10
None
A
3
A+B and E
1000
10x700μs
10
None
A
4
A and E,
B earthed
B and E,
A earthed
4000
10x700μs
4000
10x700μs
10
Primary
A
5
10
Primary
A
6
A+B and E
4000
10x700μs
10
Primary
A
A
25
B
E
Equipment Under Test
Decoupling
Elements
Surge
Generator
A
25
R
3
= 25
B
E
Equipment Under Test
Decoupling
Elements
Surge
Generator
a) Transversal test
b) Longitudinal test
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