
REV. A
OP470
–10–
Figure 6 shows peak-to-peak noise versus source resistance over
the 0.1 Hz to 10 Hz range. Once again, at low values of R
S
, the
voltage noise of the OP470 is the major contributor to peak-to-peak
noise with current noise the major contributor as R
S
increases.
The crossover point between the OP470 and the OP400 for
peak-to-peak noise is at R
S
= 17 k
W
.
The OP471 is a higher speed version of the OP470, with a slew
rate of 8 V/
m
s. Noise of the OP471 is only slightly higher than
the OP470. Like the OP470, the OP471 is unity-gain stable.
RS – SOURCE RESISTANCE –
1000
10
100
100k
P
100
10k
1k
OP11
OP400
OP471
OP470
RESISTOR
NOISE ONLY
Figure 6. Peak-To-Peak Noise (0.1 Hz to 10 Hz) vs. Source
Resistance (Includes Resistor Noise)
For reference, typical source resistances of some signal sources
are listed in Table I.
R1
5
R3
1.24k
OP470
DUT
R2
5
R5
909
OP27E
R4
200
C1
2 F
R6
600k
R9
306k
OP15E
R8
10k
D1
1N4148
D2
1N4148
C2
0.032 F
R10
65.4k
R11
65.4k
C3
0.22 F
OP15E
C4
0.22 F
R13
5.9k
R12
10k
R14
4.99k
C5
1 F
e
OUT
GAIN = 50,000
V
S
= 5V
Figure 7. Peak-To-Peak Voltage Noise Test Circuit (0.1 Hz to 10 Hz)
TABLE I.
Device
Impedance
<500
W
Source
Comments
Strain gauge
Typically used in
low frequency applications.
Magnetic
tapehead
<1500
W
Low I
B
very important to reduce
self-magnetization problems
when direct coupling is used.
OP470 I
B
can be neglected.
Similar need for low I
B
in direct
coupled applications. OP470
will not introduce any self-
magnetization problem.
Magnetic
phonograph
cartridges
<1500
W
Linear variable <1500
W
differential
transformer
Used in rugged servo-feedback
applications. Bandwidth of
interest is 400 Hz to 5 kHz.
For further information regarding noise calculations, see “Minimization of Noise
in Op Amp Applications,” Application Note AN-15.
NOISE MEASUREMENTS—
PEAK-TO-PEAK VOLTAGE NOISE
The circuit of Figure 7 is a test setup for measuring peak-to-peak
voltage noise. To measure the 200 nV peak-to-peak noise speci-
fication of the OP470 in the 0.1 Hz to 10 Hz range, the following
precautions must be observed:
1. The device must be warmed up for at least five minutes. As
shown in the warm-up drift curve, the offset voltage typi-
cally changes 5
m
V due to increasing chip temperature after
power-up. In the 10-second measurement interval, these
temperature-induced effects can exceed tens of nanovolts.
2. For similar reasons, the device must be well-shielded from
air currents. Shielding also minimizes thermocouple effects.
3. Sudden motion in the vicinity of the device can also “feedthrough”
to increase the observed noise.