參數(shù)資料
型號: NM93C56LZEN
廠商: NATIONAL SEMICONDUCTOR CORP
元件分類: PROM
英文描述: 256-/1024-/2048-/4096-Bit Serial EEPROM with Zero Power and Extended Voltage (2.7V to 5.5V)
中文描述: 128 X 16 MICROWIRE BUS SERIAL EEPROM, PDIP8
封裝: PLASTIC, DIP-8
文件頁數(shù): 5/12頁
文件大小: 204K
代理商: NM93C56LZEN
STANDARD VOLTAGE (4.5V
s
V
CC
s
5.5V) SPECIFICATIONS
(Continued)
DC and AC Electrical Characteristics
V
CC
e
5.0V
g
10% unless otherwise specified (Continued)
Symbol
Parameter
Part Number
Conditions
Min
Max
Units
t
DIS
DI Setup Time
NM93C06/46/56/66LZ
NM93C06/46/56/66LZE/V
Relative to SK
100
200
ns
t
CSH
CS Hold Time
Relative to SK
0
ns
t
DIH
DI Hold Time
Relative to SK
20
ns
t
PD1
Output Delay to ‘‘1’’
NM93C06/46/56/66LZ
NM93C06/46/56/66LZE/V
AC Test
500
500
ns
t
PD0
Output Delay to ‘‘0’’
NM93C06/46/56/66LZ
NM93C06/46/56/66LZE/V
AC Test
500
500
ns
t
SV
CS to Status Valid
NM93C06/46/56/66LZ
NM93C06/46/56/66LZE/V
AC Test
500
500
ns
t
DF
CS to DO in TRI-STATE
NM93C06/46/56/66LZ
NM93C06/46/56/66LZE/V
AC Test
CS
e
V
IL
100
100
ns
t
WP
Write Cycle Time
10
ms
AC Test Conditions
Output Load: 1 TTL Gate and C
L
e
100 pF
V
CC
Range
AC Test Conditions
4.5V
k
V
CC
k
5.5V
Input Pulse Levels
Timing Measurement Level (V
IL
/V
IH
)
Timing Measurement Level (V
OL
/V
OH
) 0.8V and 2.0V
(TTL Load Condition:
I
OL
e
2.1 mA, I
OH
e b
0.4 mA)
0.8V and 2.0V
0.9V and 1.9V
2.7V
k
V
CC
k
4.5V
Input Pulse Levels
Timing Measurement Level (V
IL
/V
IH
)
Timing Measurement Level (V
OL
/V
OH
) 0.8V and 1.6V
(CMOS Load Condition:
I
OL
e
10
m
A, I
OH
e b
10
m
A)
0.3V and 0.8 V
CC
0.4V and 1.6V
Capacitance
T
A
e
25
§
C, f
e
1 MHz
Symbol
Test
Max
Units
C
OUT
Output Capacitance
5
pF
C
IN
Input Capacitance
5
pF
Note 1:
Stress above those listed under ‘‘Absolute Maximum Ratings’’ may cause permanent damage to the device. This is a stress rating only, and functional
operation of the device at these or any other conditions above those indicated in the operational sections of the specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
Note 2:
Minimum V
CC
requirements: All functional modes are guaranteed to full operation at V
CC
t
2V except the bulk programming op-codes ERAL and WRAL.
These are regarded as test mode commands and are only guaranteed to V
CC
t
2.5V.
Note 3:
CS must be brought low for a minimum of 1 t
CS
between consecutive instruction cycles.
http://www.national.com
5
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