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參數(shù)資料
| 型號： | NLAST9431MTR2G |
| 廠商： | ON Semiconductor |
| 文件頁數(shù)： | 5/11頁 |
| 文件大小： | 0K |
| 描述： | IC SWITCH DUAL DPDT 16WQFN |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 功能： | 開關(guān) |
| 電路： | 2 x DPDT |
| 導(dǎo)通狀態(tài)電阻： | 30 歐姆 |
| 電壓電源： | 單電源 |
| 電壓 - 電源，單路/雙路(±)： | 2 V ~ 5.5 V |
| 電流 - 電源： | 4µA |
| 工作溫度： | -55°C ~ 125°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 16-WFQFN 裸露焊盤 |
| 供應(yīng)商設(shè)備封裝： | 16-WQFN（1.8x2.6） |
| 包裝： | 剪切帶 (CT) |
| 其它名稱： | NLAST9431MTR2GOSCT |
NLAST9431
http://onsemi.com
3
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
Positive DC Supply Voltage
*0.5 to )7.0
V
VIS
Analog Input Voltage (VNO or VCOM)
*0.5 ≤ VIS ≤ VCC )0.5
V
VIN
Digital Select Input Voltage
*0.5 ≤ VI ≤ )7.0
V
IIK
DC Current, Into or Out of Any Pin
$50
mA
PD
Power Dissipation in Still Air
QFN16
TSSOP16
800
450
mW
TSTG
Storage Temperature Range
*65 to )150
°C
TL
Lead Temperature, 1 mm from Case for 10 Seconds
260
°C
TJ
Junction Temperature Under Bias
+150
°C
MSL
Moisture Sensitivity
Level 1
FR
Flammability Rating
Oxygen Index: 30% 35%
UL94VO (0.125 in)
ILATCHUP LatchUp Performance
$300
mA
qJA
Thermal Resistance
QFN16
TSSOP16
80
164
°C/W
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Unit
VCC
DC Supply Voltage
2.0
5.5
V
VIN
Digital Select Input Voltage
GND
5.5
V
VIS
Analog Input Voltage (NC, NO, COM)
GND
VCC
V
TA
Operating Temperature Range
*55
)125
°C
tr, tf
Input Rise or Fall Time, SELECT
VCC = 3.3 V $ 0.3 V
VCC = 5.0 V $ 0.5 V
0
100
20
ns/V
DEVICE JUNCTION TEMPERATURE VERSUS
TIME TO 0.1% BOND FAILURES
Junction
Temperature °C
Time, Hours
Time, Years
80
1,032,200
117.8
90
419,300
47.9
100
178,700
20.4
110
79,600
9.4
120
37,000
4.2
130
17,800
2.0
140
8,900
1.0
1
10
100
1000
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
Figure 3. Failure Rate vs. Time Junction Temperature
NORMALIZED
F
AILURE
RA
T
E
TIME, YEARS
T
J=
1
30
°C
T
J=
1
20
°C
T
J=
1
10
°C
T
J=
1
00
°C
T
J=
9
0°
C
T
J=
8
0°
C
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